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In Situ Probing the Relaxation Properties of Ultrathin Polystyrene Films by Using Electric Force Microscopy

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ABSTRACT

The rapid development of nanoscience and nanotechnology involves polymer films with thickness down to nanometer scale. However, the properties of ultrathin polymer films are extremely different from that of bulk matrix or thin films. It is challenging to distinguish the changes of physical properties in ultrathin films using conventional techniques especially when it locates near the glass transition temperature (Tg). In this work, we successfully evaluated a series of physical properties of ultrathin polystyrene (PS) films by in situ characterizing the discharging behavior of the patterned charges using electric force microscopy. By monitoring the surface potential in real time, we found that the Tg of ultrathin PS films is clearly independent of film thickness, which are greatly different from that of thin PS films (film thickness larger than 10 nm).

No MeSH data available.


Surface potential images of patterned charges on ultrathin PS films with a thickness of 6 nm a with time extension under a constant temperature of 318 K and b under different temperatures for 3 min
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Fig3: Surface potential images of patterned charges on ultrathin PS films with a thickness of 6 nm a with time extension under a constant temperature of 318 K and b under different temperatures for 3 min

Mentions: The in situ surface potential images corresponding to electric charges with time extension or against temperature increase are recorded by EFM (Fig. 3). Accordingly, the charge dissipation is slow at low temperature, while it is accelerated upon the increase of temperature. At a relatively high temperature, e.g., 358 K, the charges are mostly dissipated in a few minutes, along with the disappearance of surface potentials.Fig. 3


In Situ Probing the Relaxation Properties of Ultrathin Polystyrene Films by Using Electric Force Microscopy
Surface potential images of patterned charges on ultrathin PS films with a thickness of 6 nm a with time extension under a constant temperature of 318 K and b under different temperatures for 3 min
© Copyright Policy - OpenAccess
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC5383798&req=5

Fig3: Surface potential images of patterned charges on ultrathin PS films with a thickness of 6 nm a with time extension under a constant temperature of 318 K and b under different temperatures for 3 min
Mentions: The in situ surface potential images corresponding to electric charges with time extension or against temperature increase are recorded by EFM (Fig. 3). Accordingly, the charge dissipation is slow at low temperature, while it is accelerated upon the increase of temperature. At a relatively high temperature, e.g., 358 K, the charges are mostly dissipated in a few minutes, along with the disappearance of surface potentials.Fig. 3

View Article: PubMed Central - PubMed

ABSTRACT

The rapid development of nanoscience and nanotechnology involves polymer films with thickness down to nanometer scale. However, the properties of ultrathin polymer films are extremely different from that of bulk matrix or thin films. It is challenging to distinguish the changes of physical properties in ultrathin films using conventional techniques especially when it locates near the glass transition temperature (Tg). In this work, we successfully evaluated a series of physical properties of ultrathin polystyrene (PS) films by in situ characterizing the discharging behavior of the patterned charges using electric force microscopy. By monitoring the surface potential in real time, we found that the Tg of ultrathin PS films is clearly independent of film thickness, which are greatly different from that of thin PS films (film thickness larger than 10 nm).

No MeSH data available.