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Aqueous Chemical Solution Deposition of Novel, Thick and Dense Lattice-Matched Single Buffer Layers Suitable for YBCO Coated Conductors: Preparation and Characterization

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ABSTRACT

In this work we present the preparation and characterization of cerium doped lanthanum zirconate (LCZO) films and non-stoichiometric lanthanum zirconate (LZO) buffer layers on metallic Ni-5% W substrates using chemical solution deposition (CSD), starting from aqueous precursor solutions. La2Zr2O7 films doped with varying percentages of Ce at constant La concentration (La0.5CexZr1−xOy) were prepared as well as non-stoichiometric La0.5+xZr0.5−xOy buffer layers with different percentages of La and Zr ratios. The variation in the composition of these thin films enables the creation of novel buffer layers with tailored lattice parameters. This leads to different lattice mismatches with the YBa2Cu3O7−x (YBCO) superconducting layer on top and with the buffer layers or substrate underneath. This possibility of minimized lattice mismatch should allow the use of one single buffer layer instead of the current complicated buffer architectures such as Ni-(5% W)/LZO/LZO/CeO2. Here, single, crack-free LCZO and non-stoichiometric LZO layers with thicknesses of up to 140 nm could be obtained in one single CSD step. The crystallinity and microstructure of these layers were studied by XRD, and SEM and the effective buffer layer action was studied using XPS depth profiling.

No MeSH data available.


Phi-scan measurements of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers deposited on top of the Ni-5% W substrate in comparison to the (1 1 1) plane of the Ni-5% W substrate.
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nanomaterials-02-00298-f002: Phi-scan measurements of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers deposited on top of the Ni-5% W substrate in comparison to the (1 1 1) plane of the Ni-5% W substrate.

Mentions: Figure 2 represents the phi-scans carried out to measure the in-plane grain misalignment of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers. From this figure it can be seen that the layers have clearly grown with a 45° rotation on top of the c-axis oriented Ni-5% W substrate indicating that the biaxial texture from the substrate was successfully transferred to the buffer layers. The average full width at half maximum (FWHM) of the reflections for the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers were found to be 7.62° and 6.75°, respectively.


Aqueous Chemical Solution Deposition of Novel, Thick and Dense Lattice-Matched Single Buffer Layers Suitable for YBCO Coated Conductors: Preparation and Characterization
Phi-scan measurements of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers deposited on top of the Ni-5% W substrate in comparison to the (1 1 1) plane of the Ni-5% W substrate.
© Copyright Policy
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC5304583&req=5

nanomaterials-02-00298-f002: Phi-scan measurements of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers deposited on top of the Ni-5% W substrate in comparison to the (1 1 1) plane of the Ni-5% W substrate.
Mentions: Figure 2 represents the phi-scans carried out to measure the in-plane grain misalignment of the (2 2 2) plane of the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers. From this figure it can be seen that the layers have clearly grown with a 45° rotation on top of the c-axis oriented Ni-5% W substrate indicating that the biaxial texture from the substrate was successfully transferred to the buffer layers. The average full width at half maximum (FWHM) of the reflections for the La0.50Ce0.40Zr0.10Oy and La0.60Zr0.40Oy buffer layers were found to be 7.62° and 6.75°, respectively.

View Article: PubMed Central - PubMed

ABSTRACT

In this work we present the preparation and characterization of cerium doped lanthanum zirconate (LCZO) films and non-stoichiometric lanthanum zirconate (LZO) buffer layers on metallic Ni-5% W substrates using chemical solution deposition (CSD), starting from aqueous precursor solutions. La2Zr2O7 films doped with varying percentages of Ce at constant La concentration (La0.5CexZr1−xOy) were prepared as well as non-stoichiometric La0.5+xZr0.5−xOy buffer layers with different percentages of La and Zr ratios. The variation in the composition of these thin films enables the creation of novel buffer layers with tailored lattice parameters. This leads to different lattice mismatches with the YBa2Cu3O7−x (YBCO) superconducting layer on top and with the buffer layers or substrate underneath. This possibility of minimized lattice mismatch should allow the use of one single buffer layer instead of the current complicated buffer architectures such as Ni-(5% W)/LZO/LZO/CeO2. Here, single, crack-free LCZO and non-stoichiometric LZO layers with thicknesses of up to 140 nm could be obtained in one single CSD step. The crystallinity and microstructure of these layers were studied by XRD, and SEM and the effective buffer layer action was studied using XPS depth profiling.

No MeSH data available.