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Transmission enhancement based on strong interference in metal-semiconductor layered film for energy harvesting.

Li Q, Du K, Mao K, Fang X, Zhao D, Ye H, Qiu M - Sci Rep (2016)

Bottom Line: In a metallic film coated with a thin semiconductor film, both transmission and absorption are simultaneously enhanced as a result of dramatically reduced reflection.These planar layered films for transmission enhancement feature ultrathin thickness, broadband and wide-angle operation, and reduced resistance.This strategy relies on no patterned nanostructures and thereby may power up a wide spectrum of energy-harvesting applications such as thin-film photovoltaics and surface photocatalysis.

View Article: PubMed Central - PubMed

Affiliation: State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China.

ABSTRACT
A fundamental strategy to enhance optical transmission through a continuous metallic film based on strong interference dominated by interface phase shift is developed. In a metallic film coated with a thin semiconductor film, both transmission and absorption are simultaneously enhanced as a result of dramatically reduced reflection. For a 50-nm-thick Ag film, experimental transmission enhancement factors of 4.5 and 9.5 are realized by exploiting Ag/Si non-symmetric and Si/Ag/Si symmetric geometries, respectively. These planar layered films for transmission enhancement feature ultrathin thickness, broadband and wide-angle operation, and reduced resistance. Considering one of their potential applications as transparent metal electrodes in solar cells, a calculated 182% enhancement in the total transmission efficiency relative to a single metallic film is expected. This strategy relies on no patterned nanostructures and thereby may power up a wide spectrum of energy-harvesting applications such as thin-film photovoltaics and surface photocatalysis.

No MeSH data available.


Related in: MedlinePlus

Measured (a) reflection and (c) absorption at normal incident angle, respectively. (b,d) are corresponding simulation results.
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f3: Measured (a) reflection and (c) absorption at normal incident angle, respectively. (b,d) are corresponding simulation results.

Mentions: The transmission is directly related to the reflection and the absorption. To further explore their correlation, measured and simulated reflection (R) and absorption (A =1−R−T) of Ag/Si double-layered films at normal incidence for 30-nm-thick Ag are presented in Fig. 3. The results for Ag/Si double-layered films with other Ag thicknesses (20, 40 and 50 nm) are presented in Figs S4 and S5 in the Supplementary Materials. For single 30-nm-thick Ag film, the measured reflection increases with wavelength and reaches 75% at 780 nm wavelength while the absorption is around 20% from 400 to 780 nm wavelength. While the transmission is significantly enhanced resulting from the strong interference after the Si layer is imposed, the absorption is also remarkably augmented. For a 15-nm-thick Si coating, the measured reflection is reduced to nearly at 470 nm, which is slightly shorter than peak transmission wavelength (around 550 nm). Meanwhile, the peak absorption is dramatically increased to above 70% at 470 nm, well surpassing that of a single Ag film (around 20%). Therefore, the significantly reduced reflection contributes to enhanced transmission as well as enhanced absorption.


Transmission enhancement based on strong interference in metal-semiconductor layered film for energy harvesting.

Li Q, Du K, Mao K, Fang X, Zhao D, Ye H, Qiu M - Sci Rep (2016)

Measured (a) reflection and (c) absorption at normal incident angle, respectively. (b,d) are corresponding simulation results.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4940859&req=5

f3: Measured (a) reflection and (c) absorption at normal incident angle, respectively. (b,d) are corresponding simulation results.
Mentions: The transmission is directly related to the reflection and the absorption. To further explore their correlation, measured and simulated reflection (R) and absorption (A =1−R−T) of Ag/Si double-layered films at normal incidence for 30-nm-thick Ag are presented in Fig. 3. The results for Ag/Si double-layered films with other Ag thicknesses (20, 40 and 50 nm) are presented in Figs S4 and S5 in the Supplementary Materials. For single 30-nm-thick Ag film, the measured reflection increases with wavelength and reaches 75% at 780 nm wavelength while the absorption is around 20% from 400 to 780 nm wavelength. While the transmission is significantly enhanced resulting from the strong interference after the Si layer is imposed, the absorption is also remarkably augmented. For a 15-nm-thick Si coating, the measured reflection is reduced to nearly at 470 nm, which is slightly shorter than peak transmission wavelength (around 550 nm). Meanwhile, the peak absorption is dramatically increased to above 70% at 470 nm, well surpassing that of a single Ag film (around 20%). Therefore, the significantly reduced reflection contributes to enhanced transmission as well as enhanced absorption.

Bottom Line: In a metallic film coated with a thin semiconductor film, both transmission and absorption are simultaneously enhanced as a result of dramatically reduced reflection.These planar layered films for transmission enhancement feature ultrathin thickness, broadband and wide-angle operation, and reduced resistance.This strategy relies on no patterned nanostructures and thereby may power up a wide spectrum of energy-harvesting applications such as thin-film photovoltaics and surface photocatalysis.

View Article: PubMed Central - PubMed

Affiliation: State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China.

ABSTRACT
A fundamental strategy to enhance optical transmission through a continuous metallic film based on strong interference dominated by interface phase shift is developed. In a metallic film coated with a thin semiconductor film, both transmission and absorption are simultaneously enhanced as a result of dramatically reduced reflection. For a 50-nm-thick Ag film, experimental transmission enhancement factors of 4.5 and 9.5 are realized by exploiting Ag/Si non-symmetric and Si/Ag/Si symmetric geometries, respectively. These planar layered films for transmission enhancement feature ultrathin thickness, broadband and wide-angle operation, and reduced resistance. Considering one of their potential applications as transparent metal electrodes in solar cells, a calculated 182% enhancement in the total transmission efficiency relative to a single metallic film is expected. This strategy relies on no patterned nanostructures and thereby may power up a wide spectrum of energy-harvesting applications such as thin-film photovoltaics and surface photocatalysis.

No MeSH data available.


Related in: MedlinePlus