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Spoof localized surface plasmons on ultrathin textured MIM ring resonator with enhanced resonances.

Zhou YJ, Xiao QX, Yang BJ - Sci Rep (2015)

Bottom Line: Quality factors of resonance peaks have become much larger and multipolar resonances modes can be easily observed on the textured MIM ring resonator excited by a microstrip line.We have shown that the fabricated resonator is sensitive to the variation of both the dielectric constant and the thickness of surrounding materials under test.The spoof plasmonic resonator can be used as key elements to provide many important device functionalities such as optical communications, signal processing, and spectral engineering in the plasmonic integration platform.

View Article: PubMed Central - PubMed

Affiliation: Key Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200072, China.

ABSTRACT
We numerically demonstrate that spoof localized surface plasmons (LSPs) resonant modes can be enhanced based on ultrathin corrugated metal-insulator-metal (MIM) ring resonator. Further enhancement of the LSPs modes has been achieved by incorporating an efficient and ease-of-integration exciting method. Quality factors of resonance peaks have become much larger and multipolar resonances modes can be easily observed on the textured MIM ring resonator excited by a microstrip line. Experimental results validate the high-efficiency excitation and resonance enhancements of spoof LSPs modes on the MIM ring resonator in the microwave frequencies. We have shown that the fabricated resonator is sensitive to the variation of both the dielectric constant and the thickness of surrounding materials under test. The spoof plasmonic resonator can be used as key elements to provide many important device functionalities such as optical communications, signal processing, and spectral engineering in the plasmonic integration platform.

No MeSH data available.


Experimental setup to measure the S11 parameters of (a) the fabricated sample and (b) the sample covered by thin paper card. (c) Photograph of the experimental platform to measure near electric-field distributions within the plane 0.5 mm above the sample. The setup consists in a vector network analyzer, an SFT-50-1 cable with a 0.2-mm-diameter inner conductor as the detector, coaxial cables, and a motion controller. The inset is an enlarged photograph of the sample under test in the dashed box the sample, showing the detailed arrangements of the detecting probe, feeding cable and the sample.
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f9: Experimental setup to measure the S11 parameters of (a) the fabricated sample and (b) the sample covered by thin paper card. (c) Photograph of the experimental platform to measure near electric-field distributions within the plane 0.5 mm above the sample. The setup consists in a vector network analyzer, an SFT-50-1 cable with a 0.2-mm-diameter inner conductor as the detector, coaxial cables, and a motion controller. The inset is an enlarged photograph of the sample under test in the dashed box the sample, showing the detailed arrangements of the detecting probe, feeding cable and the sample.

Mentions: The fabricated sample is connected to Vector Network Analyzer (VNA, Agilent N5227A) to obtain the reflection coefficients, as illustrated in Fig. 9(a). The materials under test are put on the sample, as shown in Fig. 9(b). Figure 9(c) demonstrates the whole experimental setup to measure the distributions of the surface electric fields on the MIM ring resonator sample. The experimental setup consists of an Agilent N5227A, translation stages, coaxial lines, and a monopole antenna as detector. The sample is pasted on the foam which is mounted to two computer-controlled linear translation stages, enabling a scanning area of 26 mm by 24 mm with a resolution of 0.2 mm. The inner conductor of the detecting probe (SFT-50-1 cable) is extended 1 mm in order to sample the z-component of the electric fields within the plane 0.5 mm above the sample. The coaxial detecting probe is fixed onto the stationary shelf.


Spoof localized surface plasmons on ultrathin textured MIM ring resonator with enhanced resonances.

Zhou YJ, Xiao QX, Yang BJ - Sci Rep (2015)

Experimental setup to measure the S11 parameters of (a) the fabricated sample and (b) the sample covered by thin paper card. (c) Photograph of the experimental platform to measure near electric-field distributions within the plane 0.5 mm above the sample. The setup consists in a vector network analyzer, an SFT-50-1 cable with a 0.2-mm-diameter inner conductor as the detector, coaxial cables, and a motion controller. The inset is an enlarged photograph of the sample under test in the dashed box the sample, showing the detailed arrangements of the detecting probe, feeding cable and the sample.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4588594&req=5

f9: Experimental setup to measure the S11 parameters of (a) the fabricated sample and (b) the sample covered by thin paper card. (c) Photograph of the experimental platform to measure near electric-field distributions within the plane 0.5 mm above the sample. The setup consists in a vector network analyzer, an SFT-50-1 cable with a 0.2-mm-diameter inner conductor as the detector, coaxial cables, and a motion controller. The inset is an enlarged photograph of the sample under test in the dashed box the sample, showing the detailed arrangements of the detecting probe, feeding cable and the sample.
Mentions: The fabricated sample is connected to Vector Network Analyzer (VNA, Agilent N5227A) to obtain the reflection coefficients, as illustrated in Fig. 9(a). The materials under test are put on the sample, as shown in Fig. 9(b). Figure 9(c) demonstrates the whole experimental setup to measure the distributions of the surface electric fields on the MIM ring resonator sample. The experimental setup consists of an Agilent N5227A, translation stages, coaxial lines, and a monopole antenna as detector. The sample is pasted on the foam which is mounted to two computer-controlled linear translation stages, enabling a scanning area of 26 mm by 24 mm with a resolution of 0.2 mm. The inner conductor of the detecting probe (SFT-50-1 cable) is extended 1 mm in order to sample the z-component of the electric fields within the plane 0.5 mm above the sample. The coaxial detecting probe is fixed onto the stationary shelf.

Bottom Line: Quality factors of resonance peaks have become much larger and multipolar resonances modes can be easily observed on the textured MIM ring resonator excited by a microstrip line.We have shown that the fabricated resonator is sensitive to the variation of both the dielectric constant and the thickness of surrounding materials under test.The spoof plasmonic resonator can be used as key elements to provide many important device functionalities such as optical communications, signal processing, and spectral engineering in the plasmonic integration platform.

View Article: PubMed Central - PubMed

Affiliation: Key Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200072, China.

ABSTRACT
We numerically demonstrate that spoof localized surface plasmons (LSPs) resonant modes can be enhanced based on ultrathin corrugated metal-insulator-metal (MIM) ring resonator. Further enhancement of the LSPs modes has been achieved by incorporating an efficient and ease-of-integration exciting method. Quality factors of resonance peaks have become much larger and multipolar resonances modes can be easily observed on the textured MIM ring resonator excited by a microstrip line. Experimental results validate the high-efficiency excitation and resonance enhancements of spoof LSPs modes on the MIM ring resonator in the microwave frequencies. We have shown that the fabricated resonator is sensitive to the variation of both the dielectric constant and the thickness of surrounding materials under test. The spoof plasmonic resonator can be used as key elements to provide many important device functionalities such as optical communications, signal processing, and spectral engineering in the plasmonic integration platform.

No MeSH data available.