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Insight into Evolution, Processing and Performance of Multi-length-scale Structures in Planar Heterojunction Perovskite Solar Cells.

Huang YC, Tsao CS, Cho YJ, Chen KC, Chiang KM, Hsiao SY, Chen CW, Su CJ, Jeng US, Lin HW - Sci Rep (2015)

Bottom Line: The result is complementary to the currently microscopic study.The GISAXS/GIWAXS measurement provides the comprehensive understanding of concurrent evolution of the film morphology and crystallization correlated to the high performance.The result can provide the insight into formation mechanism and rational synthesis design.

View Article: PubMed Central - PubMed

Affiliation: Institute of Nuclear Energy Research, Longtan, Taoyuan 32546, Taiwan.

ABSTRACT
The structural characterization correlated to the processing control of hierarchical structure of planar heterojunction perovskite layer is still incomplete due to the limitations of conventional microscopy and X-ray diffraction. This present study performed the simultaneously grazing-incidence small-angle scattering and wide-angle scattering (GISAXS/GIWAXS) techniques to quantitatively probe the hierarchical structure of the planar heterojunction perovskite solar cells. The result is complementary to the currently microscopic study. Correlation between the crystallization behavior, crystal orientation, nano- and meso-scale internal structure and surface morphology of perovskite film as functions of various processing control parameters is reported for the first time. The structural transition from the fractal pore network to the surface fractal can be tuned by the chloride percentage. The GISAXS/GIWAXS measurement provides the comprehensive understanding of concurrent evolution of the film morphology and crystallization correlated to the high performance. The result can provide the insight into formation mechanism and rational synthesis design.

No MeSH data available.


GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively.
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f4: GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively.

Mentions: Figure 4 shows the GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively. The GISAXS profiles prepared with 0 and 10% of chloride show the behavior of power-law scattering (I(Q) ∝ Q−α; 1 ≤ α ≤ 3) in the middle Q range (0.007 ~ 0.03 Å−1). Here, the exponent values, α, reveal the typical characteristic of mass fractal333435. The only best fitting model needs to include the structure factor of fractal network comprised of the primary particles/or pores. The GISAXS is mainly contributed by the morphology of multi-length-scale fractal network structure formed from the aggregation of primary pores here. The GISAXS intensity profile can be expressed as343536


Insight into Evolution, Processing and Performance of Multi-length-scale Structures in Planar Heterojunction Perovskite Solar Cells.

Huang YC, Tsao CS, Cho YJ, Chen KC, Chiang KM, Hsiao SY, Chen CW, Su CJ, Jeng US, Lin HW - Sci Rep (2015)

GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4559897&req=5

f4: GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively.
Mentions: Figure 4 shows the GISAXS profiles of the one-step solution-processed CH3NH3PbI3−xClx films prepared with 0, 10, 20 and 40% of chloride, respectively. The GISAXS profiles prepared with 0 and 10% of chloride show the behavior of power-law scattering (I(Q) ∝ Q−α; 1 ≤ α ≤ 3) in the middle Q range (0.007 ~ 0.03 Å−1). Here, the exponent values, α, reveal the typical characteristic of mass fractal333435. The only best fitting model needs to include the structure factor of fractal network comprised of the primary particles/or pores. The GISAXS is mainly contributed by the morphology of multi-length-scale fractal network structure formed from the aggregation of primary pores here. The GISAXS intensity profile can be expressed as343536

Bottom Line: The result is complementary to the currently microscopic study.The GISAXS/GIWAXS measurement provides the comprehensive understanding of concurrent evolution of the film morphology and crystallization correlated to the high performance.The result can provide the insight into formation mechanism and rational synthesis design.

View Article: PubMed Central - PubMed

Affiliation: Institute of Nuclear Energy Research, Longtan, Taoyuan 32546, Taiwan.

ABSTRACT
The structural characterization correlated to the processing control of hierarchical structure of planar heterojunction perovskite layer is still incomplete due to the limitations of conventional microscopy and X-ray diffraction. This present study performed the simultaneously grazing-incidence small-angle scattering and wide-angle scattering (GISAXS/GIWAXS) techniques to quantitatively probe the hierarchical structure of the planar heterojunction perovskite solar cells. The result is complementary to the currently microscopic study. Correlation between the crystallization behavior, crystal orientation, nano- and meso-scale internal structure and surface morphology of perovskite film as functions of various processing control parameters is reported for the first time. The structural transition from the fractal pore network to the surface fractal can be tuned by the chloride percentage. The GISAXS/GIWAXS measurement provides the comprehensive understanding of concurrent evolution of the film morphology and crystallization correlated to the high performance. The result can provide the insight into formation mechanism and rational synthesis design.

No MeSH data available.