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Structural and Photoconductivity Properties of Tellurium/PMMA Films.

Carotenuto G, Palomba M, De Nicola S, Ambrosone G, Coscia U - Nanoscale Res Lett (2015)

Bottom Line: A novel material was obtained by binding the nanosized tellurium grains with poly(methyl methacrylate) (PMMA) polymer.The prepared material was composed of hexagonal tellurium and α-phase of tellurium oxide.Data analysis shows that the photoconductivity of the film with sandwich contact configuration is a linear function of the light power density and increases more than 2 orders of magnitude as compared to the photoresponse of the film with coplanar contact configuration.

View Article: PubMed Central - PubMed

Affiliation: Institute for Polymers, Composites and Biomaterials, National Research Council, Piazzale E. Fermi 1, 80055, Portici, Naples, Italy.

ABSTRACT
Owing to the very brittle nature of tellurium powder, nanoscopic grains with an average size of 4.8 ± 0.8 nm were produced by dry vibration milling technique using a mixer/mill apparatus. A novel material was obtained by binding the nanosized tellurium grains with poly(methyl methacrylate) (PMMA) polymer. The morphology, elemental composition, and structural and optical properties of Te/PMMA films were investigated. The prepared material was composed of hexagonal tellurium and α-phase of tellurium oxide. The electrical properties of the films were studied, for different electrode contact configurations, in dark condition and under white light illumination varying the optical power density from 2 to 170 mW/cm(2) and turning the light on and off cyclically. Data analysis shows that the photoconductivity of the film with sandwich contact configuration is a linear function of the light power density and increases more than 2 orders of magnitude as compared to the photoresponse of the film with coplanar contact configuration.

No MeSH data available.


XRD diffractogram of the Te/PMMA film (a) and “as received” tellurium powder (b)
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Fig5: XRD diffractogram of the Te/PMMA film (a) and “as received” tellurium powder (b)

Mentions: The structural properties of the Te/PMMA material were studied by XRD measurements. In Fig. 5a, the XRD diffractogram shows a prominent peak at 27.32° belonging to the diffraction pattern of the hexagonal tellurium (JCPDS card 36-1452) and two other less intensive diffraction peaks at 25.99° and 29.79° due to the α-phase of tellurium oxide (α-TeO2, JCPDS card 78-1713). Both Te and α-TeO2 phases were already present in the “as received” Te powder, as shown in the XRD spectrum of Fig. 5b; however, in the case of the Te/PMMA film, the peaks are broadened because the sample was composed of nanoscopic Te grains, achieved at the end of the milling process. Furthermore, according to the integrated area of the diffraction peaks, the composition of the film was 53 % Te and 47 % α-TeO2, while for the “as received” powder it was 80.8 % Te and 19.2 % α-TeO2. The higher value of the α-TeO2 phase percentage in the film can be ascribed to an oxidation process of the Te grains occurring during the milling stage.Fig. 5


Structural and Photoconductivity Properties of Tellurium/PMMA Films.

Carotenuto G, Palomba M, De Nicola S, Ambrosone G, Coscia U - Nanoscale Res Lett (2015)

XRD diffractogram of the Te/PMMA film (a) and “as received” tellurium powder (b)
© Copyright Policy - OpenAccess
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4526513&req=5

Fig5: XRD diffractogram of the Te/PMMA film (a) and “as received” tellurium powder (b)
Mentions: The structural properties of the Te/PMMA material were studied by XRD measurements. In Fig. 5a, the XRD diffractogram shows a prominent peak at 27.32° belonging to the diffraction pattern of the hexagonal tellurium (JCPDS card 36-1452) and two other less intensive diffraction peaks at 25.99° and 29.79° due to the α-phase of tellurium oxide (α-TeO2, JCPDS card 78-1713). Both Te and α-TeO2 phases were already present in the “as received” Te powder, as shown in the XRD spectrum of Fig. 5b; however, in the case of the Te/PMMA film, the peaks are broadened because the sample was composed of nanoscopic Te grains, achieved at the end of the milling process. Furthermore, according to the integrated area of the diffraction peaks, the composition of the film was 53 % Te and 47 % α-TeO2, while for the “as received” powder it was 80.8 % Te and 19.2 % α-TeO2. The higher value of the α-TeO2 phase percentage in the film can be ascribed to an oxidation process of the Te grains occurring during the milling stage.Fig. 5

Bottom Line: A novel material was obtained by binding the nanosized tellurium grains with poly(methyl methacrylate) (PMMA) polymer.The prepared material was composed of hexagonal tellurium and α-phase of tellurium oxide.Data analysis shows that the photoconductivity of the film with sandwich contact configuration is a linear function of the light power density and increases more than 2 orders of magnitude as compared to the photoresponse of the film with coplanar contact configuration.

View Article: PubMed Central - PubMed

Affiliation: Institute for Polymers, Composites and Biomaterials, National Research Council, Piazzale E. Fermi 1, 80055, Portici, Naples, Italy.

ABSTRACT
Owing to the very brittle nature of tellurium powder, nanoscopic grains with an average size of 4.8 ± 0.8 nm were produced by dry vibration milling technique using a mixer/mill apparatus. A novel material was obtained by binding the nanosized tellurium grains with poly(methyl methacrylate) (PMMA) polymer. The morphology, elemental composition, and structural and optical properties of Te/PMMA films were investigated. The prepared material was composed of hexagonal tellurium and α-phase of tellurium oxide. The electrical properties of the films were studied, for different electrode contact configurations, in dark condition and under white light illumination varying the optical power density from 2 to 170 mW/cm(2) and turning the light on and off cyclically. Data analysis shows that the photoconductivity of the film with sandwich contact configuration is a linear function of the light power density and increases more than 2 orders of magnitude as compared to the photoresponse of the film with coplanar contact configuration.

No MeSH data available.