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Light Trapping Enhancement in a Thin Film with 2D Conformal Periodic Hexagonal Arrays.

Yang X, Zhou S, Wang D, He J, Zhou J, Li X, Gao P, Ye J - Nanoscale Res Lett (2015)

Bottom Line: Compared with the planar reference, the double-sided conformal periodic structures with all feature periodicities of sub-wavelength (300 nm), mid-wavelength (640 nm), and infrared wavelength (2300 nm) show significant broadband absorption enhancements under wide angles.The films with an optimum periodicity of 300 nm exhibit outstanding antireflection and excellent trade-off between light scattering performance and parasitic absorption loss.The average absorption of the optimum structure with a thickness of 160 nm is 64.8 %, which is much larger than the planar counterpart of 38.5 %.

View Article: PubMed Central - PubMed

Affiliation: Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China, yangx@nimte.ac.cn.

ABSTRACT
Applying a periodic light trapping array is an effective method to improve the optical properties in thin-film solar cells. In this work, we experimentally and theoretically investigate the light trapping properties of two-dimensional periodic hexagonal arrays in the framework of a conformal amorphous silicon film. Compared with the planar reference, the double-sided conformal periodic structures with all feature periodicities of sub-wavelength (300 nm), mid-wavelength (640 nm), and infrared wavelength (2300 nm) show significant broadband absorption enhancements under wide angles. The films with an optimum periodicity of 300 nm exhibit outstanding antireflection and excellent trade-off between light scattering performance and parasitic absorption loss. The average absorption of the optimum structure with a thickness of 160 nm is 64.8 %, which is much larger than the planar counterpart of 38.5 %. The methodology applied in this work can be generalized to rational design of other types of high-performance thin-film photovoltaic devices based on a broad range of materials.

No MeSH data available.


SEM and AFM characterization results. The top-view SEM images of the conformal hexagonal structures with different periodicities: 300 nm (a), 600 nm (b), and 2 μm (c). The corresponding cross-sectional SEM image of the same configurations (d–f). All the scale bars are 500 nm. The tapping-mode SPM images of the surface topography of the conformal a-Si film with periodicities: 300 nm (g), 600 nm (h), and 2 μm (i)
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Fig2: SEM and AFM characterization results. The top-view SEM images of the conformal hexagonal structures with different periodicities: 300 nm (a), 600 nm (b), and 2 μm (c). The corresponding cross-sectional SEM image of the same configurations (d–f). All the scale bars are 500 nm. The tapping-mode SPM images of the surface topography of the conformal a-Si film with periodicities: 300 nm (g), 600 nm (h), and 2 μm (i)

Mentions: The scanning electron microscopy (SEM) characterization and the tapping-mode scanning probe microscope (SPM) measurement were conducted using a Hitachi S-4800 SEM and a Veeco 3100 SPM, respectively. Figure 2 shows the top-view (a–c) and cross-sectional SEM images (d–f), and SPM scans (g–i) of the surface topography of the conformal a-Si films with three types of periodicities.Fig. 2


Light Trapping Enhancement in a Thin Film with 2D Conformal Periodic Hexagonal Arrays.

Yang X, Zhou S, Wang D, He J, Zhou J, Li X, Gao P, Ye J - Nanoscale Res Lett (2015)

SEM and AFM characterization results. The top-view SEM images of the conformal hexagonal structures with different periodicities: 300 nm (a), 600 nm (b), and 2 μm (c). The corresponding cross-sectional SEM image of the same configurations (d–f). All the scale bars are 500 nm. The tapping-mode SPM images of the surface topography of the conformal a-Si film with periodicities: 300 nm (g), 600 nm (h), and 2 μm (i)
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4495099&req=5

Fig2: SEM and AFM characterization results. The top-view SEM images of the conformal hexagonal structures with different periodicities: 300 nm (a), 600 nm (b), and 2 μm (c). The corresponding cross-sectional SEM image of the same configurations (d–f). All the scale bars are 500 nm. The tapping-mode SPM images of the surface topography of the conformal a-Si film with periodicities: 300 nm (g), 600 nm (h), and 2 μm (i)
Mentions: The scanning electron microscopy (SEM) characterization and the tapping-mode scanning probe microscope (SPM) measurement were conducted using a Hitachi S-4800 SEM and a Veeco 3100 SPM, respectively. Figure 2 shows the top-view (a–c) and cross-sectional SEM images (d–f), and SPM scans (g–i) of the surface topography of the conformal a-Si films with three types of periodicities.Fig. 2

Bottom Line: Compared with the planar reference, the double-sided conformal periodic structures with all feature periodicities of sub-wavelength (300 nm), mid-wavelength (640 nm), and infrared wavelength (2300 nm) show significant broadband absorption enhancements under wide angles.The films with an optimum periodicity of 300 nm exhibit outstanding antireflection and excellent trade-off between light scattering performance and parasitic absorption loss.The average absorption of the optimum structure with a thickness of 160 nm is 64.8 %, which is much larger than the planar counterpart of 38.5 %.

View Article: PubMed Central - PubMed

Affiliation: Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China, yangx@nimte.ac.cn.

ABSTRACT
Applying a periodic light trapping array is an effective method to improve the optical properties in thin-film solar cells. In this work, we experimentally and theoretically investigate the light trapping properties of two-dimensional periodic hexagonal arrays in the framework of a conformal amorphous silicon film. Compared with the planar reference, the double-sided conformal periodic structures with all feature periodicities of sub-wavelength (300 nm), mid-wavelength (640 nm), and infrared wavelength (2300 nm) show significant broadband absorption enhancements under wide angles. The films with an optimum periodicity of 300 nm exhibit outstanding antireflection and excellent trade-off between light scattering performance and parasitic absorption loss. The average absorption of the optimum structure with a thickness of 160 nm is 64.8 %, which is much larger than the planar counterpart of 38.5 %. The methodology applied in this work can be generalized to rational design of other types of high-performance thin-film photovoltaic devices based on a broad range of materials.

No MeSH data available.