Limits...
Strain Engineering of Octahedral Rotations and Physical Properties of SrRuO3 Films.

Lu W, Song W, Yang P, Ding J, Chow GM, Chen J - Sci Rep (2015)

Bottom Line: Octahedral behavior of SrRuO3 film as a popular electrode in heterostructured devices is of particular interest for its probable interfacial coupling of octahedra with the functional overlayers.It shows that the compressively strained film on NdGaO3 substrate displays a rotation pattern of a tetragonal phase whilst the tensilely strained film on KTaO3 substrate has the rotation pattern of the bulk orthorhombic SrRuO3 phase.In addition, the compressively strained film displays a perpendicular magnetic anisotropy while the tensilely strained film has the magnetic easy axis lying in the film plane.

View Article: PubMed Central - PubMed

Affiliation: 1] Department of Materials Science and Engineering, National University of Singapore, Singapore 117576 [2] Data Storage Institute, A*STAR (Agency for Science, Technology and Research), DSI Building, 5 Engineering Drive 1, Singapore 117608.

ABSTRACT
Strain engineering is an effective way to modify functional properties of thin films. Recently, the importance of octahedral rotations in pervoskite films has been recognized in discovering and designing new functional phases. Octahedral behavior of SrRuO3 film as a popular electrode in heterostructured devices is of particular interest for its probable interfacial coupling of octahedra with the functional overlayers. Here we report the strain engineering of octahedral rotations and physical properties that has been achieved in SrRuO3 films in response to the substrate-induced misfit strains of almost the same amplitude but of opposite signs. It shows that the compressively strained film on NdGaO3 substrate displays a rotation pattern of a tetragonal phase whilst the tensilely strained film on KTaO3 substrate has the rotation pattern of the bulk orthorhombic SrRuO3 phase. In addition, the compressively strained film displays a perpendicular magnetic anisotropy while the tensilely strained film has the magnetic easy axis lying in the film plane. The results show the prospect of strain engineered octahedral architecture in producing desired property and novel functionality in the class of perovskite material.

No MeSH data available.


Related in: MedlinePlus

Cross-sectional HRTEM images and FFTs of SRO films on different substrates. (a) (d) Cross-sectional HRTEM images of SRO on (a) NGO and (d) KTO respectively. (b), (c), (e), (f) are FFTs of the films and substrates. Half-integer reflections 1/2{ooo} are circled in orange and ½ {eeo} reflections are circled in green. In (d), arrows indicate the location of dislocations and inset is the FFT of the selected area surrounded by square. The absence and presence of 1/2{ooo} type reflection in (b) and (c) indicates the absence of b− tilt in SRO film and the presence of b− tilt in the NGO substrate. Similarly, the existence of 1/2 {eeo} reflections in (e) suggests the c+ tilt in the SRO film deposited on KTO substrate.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
getmorefigures.php?uid=PMC4446894&req=5

f4: Cross-sectional HRTEM images and FFTs of SRO films on different substrates. (a) (d) Cross-sectional HRTEM images of SRO on (a) NGO and (d) KTO respectively. (b), (c), (e), (f) are FFTs of the films and substrates. Half-integer reflections 1/2{ooo} are circled in orange and ½ {eeo} reflections are circled in green. In (d), arrows indicate the location of dislocations and inset is the FFT of the selected area surrounded by square. The absence and presence of 1/2{ooo} type reflection in (b) and (c) indicates the absence of b− tilt in SRO film and the presence of b− tilt in the NGO substrate. Similarly, the existence of 1/2 {eeo} reflections in (e) suggests the c+ tilt in the SRO film deposited on KTO substrate.

Mentions: In the following, the octahedral rotations in SRO films were examined by TEM and compared with the rotation pattern determined by XRD. The cross-sectional TEM image (Fig. 4(a)) shows that for SRO film on NGO substrate, there are no misfit dislocations at the interface, consistent with the coherent growth of SRO film on NGO substrate. In comparison, dislocations (indicated by arrows in Fig. 4(d)) were found in SRO/KTO sample both at the interface and away from the interface in order to accommodate the tensile strain, in accordance with the partial relaxation of the tensilely strained film on KTO substrate.


Strain Engineering of Octahedral Rotations and Physical Properties of SrRuO3 Films.

Lu W, Song W, Yang P, Ding J, Chow GM, Chen J - Sci Rep (2015)

Cross-sectional HRTEM images and FFTs of SRO films on different substrates. (a) (d) Cross-sectional HRTEM images of SRO on (a) NGO and (d) KTO respectively. (b), (c), (e), (f) are FFTs of the films and substrates. Half-integer reflections 1/2{ooo} are circled in orange and ½ {eeo} reflections are circled in green. In (d), arrows indicate the location of dislocations and inset is the FFT of the selected area surrounded by square. The absence and presence of 1/2{ooo} type reflection in (b) and (c) indicates the absence of b− tilt in SRO film and the presence of b− tilt in the NGO substrate. Similarly, the existence of 1/2 {eeo} reflections in (e) suggests the c+ tilt in the SRO film deposited on KTO substrate.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4446894&req=5

f4: Cross-sectional HRTEM images and FFTs of SRO films on different substrates. (a) (d) Cross-sectional HRTEM images of SRO on (a) NGO and (d) KTO respectively. (b), (c), (e), (f) are FFTs of the films and substrates. Half-integer reflections 1/2{ooo} are circled in orange and ½ {eeo} reflections are circled in green. In (d), arrows indicate the location of dislocations and inset is the FFT of the selected area surrounded by square. The absence and presence of 1/2{ooo} type reflection in (b) and (c) indicates the absence of b− tilt in SRO film and the presence of b− tilt in the NGO substrate. Similarly, the existence of 1/2 {eeo} reflections in (e) suggests the c+ tilt in the SRO film deposited on KTO substrate.
Mentions: In the following, the octahedral rotations in SRO films were examined by TEM and compared with the rotation pattern determined by XRD. The cross-sectional TEM image (Fig. 4(a)) shows that for SRO film on NGO substrate, there are no misfit dislocations at the interface, consistent with the coherent growth of SRO film on NGO substrate. In comparison, dislocations (indicated by arrows in Fig. 4(d)) were found in SRO/KTO sample both at the interface and away from the interface in order to accommodate the tensile strain, in accordance with the partial relaxation of the tensilely strained film on KTO substrate.

Bottom Line: Octahedral behavior of SrRuO3 film as a popular electrode in heterostructured devices is of particular interest for its probable interfacial coupling of octahedra with the functional overlayers.It shows that the compressively strained film on NdGaO3 substrate displays a rotation pattern of a tetragonal phase whilst the tensilely strained film on KTaO3 substrate has the rotation pattern of the bulk orthorhombic SrRuO3 phase.In addition, the compressively strained film displays a perpendicular magnetic anisotropy while the tensilely strained film has the magnetic easy axis lying in the film plane.

View Article: PubMed Central - PubMed

Affiliation: 1] Department of Materials Science and Engineering, National University of Singapore, Singapore 117576 [2] Data Storage Institute, A*STAR (Agency for Science, Technology and Research), DSI Building, 5 Engineering Drive 1, Singapore 117608.

ABSTRACT
Strain engineering is an effective way to modify functional properties of thin films. Recently, the importance of octahedral rotations in pervoskite films has been recognized in discovering and designing new functional phases. Octahedral behavior of SrRuO3 film as a popular electrode in heterostructured devices is of particular interest for its probable interfacial coupling of octahedra with the functional overlayers. Here we report the strain engineering of octahedral rotations and physical properties that has been achieved in SrRuO3 films in response to the substrate-induced misfit strains of almost the same amplitude but of opposite signs. It shows that the compressively strained film on NdGaO3 substrate displays a rotation pattern of a tetragonal phase whilst the tensilely strained film on KTaO3 substrate has the rotation pattern of the bulk orthorhombic SrRuO3 phase. In addition, the compressively strained film displays a perpendicular magnetic anisotropy while the tensilely strained film has the magnetic easy axis lying in the film plane. The results show the prospect of strain engineered octahedral architecture in producing desired property and novel functionality in the class of perovskite material.

No MeSH data available.


Related in: MedlinePlus