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Nanoprocessing of layered crystalline materials by atomic force microscopy.

Miyake S, Wang M - Nanoscale Res Lett (2015)

Bottom Line: By taking advantage of the mechanical anisotropy of crystalline materials, processing at a single-layer level can be realized for layered crystalline materials with periodically weak bonds.Moreover, it is easy to image the atoms on the basal plane, where the processed shape can be observed on the atomic level.It also summarizes recent AFM results obtained by our research group regarding the atomic-scale mechanical processing of layered materials including mica, graphite, MoS2, and highly oriented pyrolytic graphite.

View Article: PubMed Central - PubMed

Affiliation: Department of Innovative System Engineering, Nippon Institute of Technology, Saitama, Japan.

ABSTRACT
By taking advantage of the mechanical anisotropy of crystalline materials, processing at a single-layer level can be realized for layered crystalline materials with periodically weak bonds. Mica (muscovite), graphite, molybdenum disulfide (MoS2), and boron nitride have layered structures, and there is little interaction between the cleavage planes existing in the basal planes of these materials. Moreover, it is easy to image the atoms on the basal plane, where the processed shape can be observed on the atomic level. This study reviews research evaluating the nanometer-scale wear and friction as well as the nanometer-scale mechanical processing of muscovite using atomic force microscopy (AFM). It also summarizes recent AFM results obtained by our research group regarding the atomic-scale mechanical processing of layered materials including mica, graphite, MoS2, and highly oriented pyrolytic graphite.

No MeSH data available.


Related in: MedlinePlus

Plowing force (Fc) dependence on processed depth.
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Fig11: Plowing force (Fc) dependence on processed depth.

Mentions: Moreover, because Fc is zero (Fc = 0) in two-pass processing until cutting is started at a critical load of 300 nN, F is represented by F = μW. Since μ is constant at low loads, Fr is determined by drawing a line with a constant gradient (μ = a constant), as shown in Figure 10. On the other hand, F is larger than Ff after cutting is started; therefore, Fc can be estimated from Fc = F − Fr. For the lateral force of the first- and second-pass processing, the plowing force terms (Fc1 and Fc2) are determined first. Fc is then calculated as the sum of Fc1 and Fc2. Figure 11 indicates an approximately proportional relationship between plowing force and processed depth. In this case, the plowing force is about 500 nN at the processed depth of 1 nm, which corresponded to the thickness of one layer. This result shows that for atomic-scale processing, lateral force is divided into the plowing force term and the friction force term, and the former term corresponds to the processed depth.Figure 11


Nanoprocessing of layered crystalline materials by atomic force microscopy.

Miyake S, Wang M - Nanoscale Res Lett (2015)

Plowing force (Fc) dependence on processed depth.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4385287&req=5

Fig11: Plowing force (Fc) dependence on processed depth.
Mentions: Moreover, because Fc is zero (Fc = 0) in two-pass processing until cutting is started at a critical load of 300 nN, F is represented by F = μW. Since μ is constant at low loads, Fr is determined by drawing a line with a constant gradient (μ = a constant), as shown in Figure 10. On the other hand, F is larger than Ff after cutting is started; therefore, Fc can be estimated from Fc = F − Fr. For the lateral force of the first- and second-pass processing, the plowing force terms (Fc1 and Fc2) are determined first. Fc is then calculated as the sum of Fc1 and Fc2. Figure 11 indicates an approximately proportional relationship between plowing force and processed depth. In this case, the plowing force is about 500 nN at the processed depth of 1 nm, which corresponded to the thickness of one layer. This result shows that for atomic-scale processing, lateral force is divided into the plowing force term and the friction force term, and the former term corresponds to the processed depth.Figure 11

Bottom Line: By taking advantage of the mechanical anisotropy of crystalline materials, processing at a single-layer level can be realized for layered crystalline materials with periodically weak bonds.Moreover, it is easy to image the atoms on the basal plane, where the processed shape can be observed on the atomic level.It also summarizes recent AFM results obtained by our research group regarding the atomic-scale mechanical processing of layered materials including mica, graphite, MoS2, and highly oriented pyrolytic graphite.

View Article: PubMed Central - PubMed

Affiliation: Department of Innovative System Engineering, Nippon Institute of Technology, Saitama, Japan.

ABSTRACT
By taking advantage of the mechanical anisotropy of crystalline materials, processing at a single-layer level can be realized for layered crystalline materials with periodically weak bonds. Mica (muscovite), graphite, molybdenum disulfide (MoS2), and boron nitride have layered structures, and there is little interaction between the cleavage planes existing in the basal planes of these materials. Moreover, it is easy to image the atoms on the basal plane, where the processed shape can be observed on the atomic level. This study reviews research evaluating the nanometer-scale wear and friction as well as the nanometer-scale mechanical processing of muscovite using atomic force microscopy (AFM). It also summarizes recent AFM results obtained by our research group regarding the atomic-scale mechanical processing of layered materials including mica, graphite, MoS2, and highly oriented pyrolytic graphite.

No MeSH data available.


Related in: MedlinePlus