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High channel count and high precision channel spacing multi-wavelength laser array for future PICs.

Shi Y, Li S, Chen X, Li L, Li J, Zhang T, Zheng J, Zhang Y, Tang S, Hou L, Marsh JH, Qiu B - Sci Rep (2014)

Bottom Line: In spite of their tremendous potential, adoption of the MLA has been hampered by a number of issues, particularly wavelength precision and fabrication cost.In this paper, we report high channel count MLAs in which the wavelengths of each channel can be determined precisely through low-cost standard μm-level photolithography/holographic lithography and the reconstruction-equivalent-chirp (REC) technique. 60-wavelength MLAs with good wavelength spacing uniformity have been demonstrated experimentally, in which nearly 83% lasers are within a wavelength deviation of ±0.20 nm, corresponding to a tolerance of ±0.032 nm in the period pitch.As a result of employing the equivalent phase shift technique, the single longitudinal mode (SLM) yield is nearly 100%, while the theoretical yield of standard DFB lasers is only around 33.3%.

View Article: PubMed Central - PubMed

Affiliation: National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Microwave-Photonics Technology Laboratory, Nanjing University, Nanjing, 210093, China.

ABSTRACT
Multi-wavelength semiconductor laser arrays (MLAs) have wide applications in wavelength multiplexing division (WDM) networks. In spite of their tremendous potential, adoption of the MLA has been hampered by a number of issues, particularly wavelength precision and fabrication cost. In this paper, we report high channel count MLAs in which the wavelengths of each channel can be determined precisely through low-cost standard μm-level photolithography/holographic lithography and the reconstruction-equivalent-chirp (REC) technique. 60-wavelength MLAs with good wavelength spacing uniformity have been demonstrated experimentally, in which nearly 83% lasers are within a wavelength deviation of ±0.20 nm, corresponding to a tolerance of ±0.032 nm in the period pitch. As a result of employing the equivalent phase shift technique, the single longitudinal mode (SLM) yield is nearly 100%, while the theoretical yield of standard DFB lasers is only around 33.3%.

No MeSH data available.


The frequency count of wavelength residual of (a) 871 lasers with seed grating Bragg wavelength of 1,640 nm and (b) 781 lasers with seed grating Bragg wavelength of 1,660 nm.The standard deviations of the two groups of lasers are 0.159 nm and 0.147 nm respectively.
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f4: The frequency count of wavelength residual of (a) 871 lasers with seed grating Bragg wavelength of 1,640 nm and (b) 781 lasers with seed grating Bragg wavelength of 1,660 nm.The standard deviations of the two groups of lasers are 0.159 nm and 0.147 nm respectively.

Mentions: As shown in Fig. 4, the standard deviations are 0.159 nm and 0.147 nm for the two different seed grating periods, which means 68.26% of the laser wavelengths are lied within ±0.159 nm and ±0.147 nm, respectively. The close values of the standard deviations (~0.01 nm difference) shows that the REC method is effective for different seed grating periods, and confirms the flexibility of the fabrication technique.


High channel count and high precision channel spacing multi-wavelength laser array for future PICs.

Shi Y, Li S, Chen X, Li L, Li J, Zhang T, Zheng J, Zhang Y, Tang S, Hou L, Marsh JH, Qiu B - Sci Rep (2014)

The frequency count of wavelength residual of (a) 871 lasers with seed grating Bragg wavelength of 1,640 nm and (b) 781 lasers with seed grating Bragg wavelength of 1,660 nm.The standard deviations of the two groups of lasers are 0.159 nm and 0.147 nm respectively.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC4260219&req=5

f4: The frequency count of wavelength residual of (a) 871 lasers with seed grating Bragg wavelength of 1,640 nm and (b) 781 lasers with seed grating Bragg wavelength of 1,660 nm.The standard deviations of the two groups of lasers are 0.159 nm and 0.147 nm respectively.
Mentions: As shown in Fig. 4, the standard deviations are 0.159 nm and 0.147 nm for the two different seed grating periods, which means 68.26% of the laser wavelengths are lied within ±0.159 nm and ±0.147 nm, respectively. The close values of the standard deviations (~0.01 nm difference) shows that the REC method is effective for different seed grating periods, and confirms the flexibility of the fabrication technique.

Bottom Line: In spite of their tremendous potential, adoption of the MLA has been hampered by a number of issues, particularly wavelength precision and fabrication cost.In this paper, we report high channel count MLAs in which the wavelengths of each channel can be determined precisely through low-cost standard μm-level photolithography/holographic lithography and the reconstruction-equivalent-chirp (REC) technique. 60-wavelength MLAs with good wavelength spacing uniformity have been demonstrated experimentally, in which nearly 83% lasers are within a wavelength deviation of ±0.20 nm, corresponding to a tolerance of ±0.032 nm in the period pitch.As a result of employing the equivalent phase shift technique, the single longitudinal mode (SLM) yield is nearly 100%, while the theoretical yield of standard DFB lasers is only around 33.3%.

View Article: PubMed Central - PubMed

Affiliation: National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Microwave-Photonics Technology Laboratory, Nanjing University, Nanjing, 210093, China.

ABSTRACT
Multi-wavelength semiconductor laser arrays (MLAs) have wide applications in wavelength multiplexing division (WDM) networks. In spite of their tremendous potential, adoption of the MLA has been hampered by a number of issues, particularly wavelength precision and fabrication cost. In this paper, we report high channel count MLAs in which the wavelengths of each channel can be determined precisely through low-cost standard μm-level photolithography/holographic lithography and the reconstruction-equivalent-chirp (REC) technique. 60-wavelength MLAs with good wavelength spacing uniformity have been demonstrated experimentally, in which nearly 83% lasers are within a wavelength deviation of ±0.20 nm, corresponding to a tolerance of ±0.032 nm in the period pitch. As a result of employing the equivalent phase shift technique, the single longitudinal mode (SLM) yield is nearly 100%, while the theoretical yield of standard DFB lasers is only around 33.3%.

No MeSH data available.