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Design multilayer antireflection coatings for terrestrial solar cells.

Zhan F, Li Z, Shen X, He H, Zeng J - ScientificWorldJournal (2014)

Bottom Line: In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer.By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation.A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

View Article: PubMed Central - PubMed

Affiliation: The Key Laboratory of Nonferrous Metal Materials and New Processing Technology of Ministry of Education, Guangxi University, Nanning 530004, China.

ABSTRACT
In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer. By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation. A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

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Related in: MedlinePlus

Schematic diagram of the optical model for stacked films.
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Related In: Results  -  Collection


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fig1: Schematic diagram of the optical model for stacked films.

Mentions: Optical interference matrix is an effective way to calculate reflectivity of film. To allow the situation that the incident angle of light is zero degree, considering the optical thin film system of N layers prepared on the substrate as shown in Figure 1, nj is the refractive index and kj is the extinction coefficient, dj is the thickness in each layer, respectively, and n0 is refractive index of air (n0 = 1). According to the refractive index and thickness of each layer, interference matrix of each layer can be determined. A characteristic matrix formulation of the film system is obtained by multiplying interference matrix of each layer [15]:(1)[BC]={∏j=1N[cosδjisinδjnjinjsinδjcosδj]}[1ns]=[M11M12M21M22][1ns],where δj is the effective optical thickness of the layer at a given wavelength. The 2δj is equal to the phase difference of two adjacent coherent light beams. Y = C/B is the optical admittance. The reflectivity R of the whole film system is expressed as(2)R=/r/2=/n0−Yn0+Y/2.


Design multilayer antireflection coatings for terrestrial solar cells.

Zhan F, Li Z, Shen X, He H, Zeng J - ScientificWorldJournal (2014)

Schematic diagram of the optical model for stacked films.
© Copyright Policy - open-access
Related In: Results  -  Collection

Show All Figures
getmorefigures.php?uid=PMC3926372&req=5

fig1: Schematic diagram of the optical model for stacked films.
Mentions: Optical interference matrix is an effective way to calculate reflectivity of film. To allow the situation that the incident angle of light is zero degree, considering the optical thin film system of N layers prepared on the substrate as shown in Figure 1, nj is the refractive index and kj is the extinction coefficient, dj is the thickness in each layer, respectively, and n0 is refractive index of air (n0 = 1). According to the refractive index and thickness of each layer, interference matrix of each layer can be determined. A characteristic matrix formulation of the film system is obtained by multiplying interference matrix of each layer [15]:(1)[BC]={∏j=1N[cosδjisinδjnjinjsinδjcosδj]}[1ns]=[M11M12M21M22][1ns],where δj is the effective optical thickness of the layer at a given wavelength. The 2δj is equal to the phase difference of two adjacent coherent light beams. Y = C/B is the optical admittance. The reflectivity R of the whole film system is expressed as(2)R=/r/2=/n0−Yn0+Y/2.

Bottom Line: In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer.By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation.A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

View Article: PubMed Central - PubMed

Affiliation: The Key Laboratory of Nonferrous Metal Materials and New Processing Technology of Ministry of Education, Guangxi University, Nanning 530004, China.

ABSTRACT
In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer. By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation. A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

Show MeSH
Related in: MedlinePlus