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New quartz oscillator switching method for nano-Henry range inductance measurements.

Matko V, Jezernik K - Sensors (Basel) (2012)

Bottom Line: The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics.This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency.The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

View Article: PubMed Central - PubMed

Affiliation: Faculty of Electrical Engineering and Computer Science, University of Maribor, Maribor, Slovenia. karel.jezernik@uni-mb.si

ABSTRACT
This article introduces a new method for nano-Henry inductance measurements at the frequency of 4.999 MHz with a single quartz crystal oscillating in the switching oscillating circuit. The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics. This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency. The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

No MeSH data available.


Frequency stability (f(Sync,k,Lm1) − fr) occurring when changing the temperature in the range 0–50 °C (measurement time 2.5 h—two cycles).
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f5-sensors-12-03105: Frequency stability (f(Sync,k,Lm1) − fr) occurring when changing the temperature in the range 0–50 °C (measurement time 2.5 h—two cycles).

Mentions: Figure 5 shows the frequency stability (f(Sync,k,Lm1) − fr) (at the beginning of temperature cycling the stable frequency was 2,064 Hz at 0 °C) occurring when changing the temperature in the range between 0 °C and 50 °C at the state Sync and fixed value Lm1 = 123.65 μH (Figure 4). The crystal used in the experiment was AT-cut (cut angle: 0′) [37] quartz crystal with temperature change ±5 ppm in the range 10 °C–30 °C. The A and B areas illustrate dynamic change of frequency at the temperature change ranging from 0 °C to 50 °C and back to 0 °C.


New quartz oscillator switching method for nano-Henry range inductance measurements.

Matko V, Jezernik K - Sensors (Basel) (2012)

Frequency stability (f(Sync,k,Lm1) − fr) occurring when changing the temperature in the range 0–50 °C (measurement time 2.5 h—two cycles).
© Copyright Policy
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3376594&req=5

f5-sensors-12-03105: Frequency stability (f(Sync,k,Lm1) − fr) occurring when changing the temperature in the range 0–50 °C (measurement time 2.5 h—two cycles).
Mentions: Figure 5 shows the frequency stability (f(Sync,k,Lm1) − fr) (at the beginning of temperature cycling the stable frequency was 2,064 Hz at 0 °C) occurring when changing the temperature in the range between 0 °C and 50 °C at the state Sync and fixed value Lm1 = 123.65 μH (Figure 4). The crystal used in the experiment was AT-cut (cut angle: 0′) [37] quartz crystal with temperature change ±5 ppm in the range 10 °C–30 °C. The A and B areas illustrate dynamic change of frequency at the temperature change ranging from 0 °C to 50 °C and back to 0 °C.

Bottom Line: The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics.This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency.The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

View Article: PubMed Central - PubMed

Affiliation: Faculty of Electrical Engineering and Computer Science, University of Maribor, Maribor, Slovenia. karel.jezernik@uni-mb.si

ABSTRACT
This article introduces a new method for nano-Henry inductance measurements at the frequency of 4.999 MHz with a single quartz crystal oscillating in the switching oscillating circuit. The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics. This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency. The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

No MeSH data available.