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New quartz oscillator switching method for nano-Henry range inductance measurements.

Matko V, Jezernik K - Sensors (Basel) (2012)

Bottom Line: The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics.This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency.The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

View Article: PubMed Central - PubMed

Affiliation: Faculty of Electrical Engineering and Computer Science, University of Maribor, Maribor, Slovenia. karel.jezernik@uni-mb.si

ABSTRACT
This article introduces a new method for nano-Henry inductance measurements at the frequency of 4.999 MHz with a single quartz crystal oscillating in the switching oscillating circuit. The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics. This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency. The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

No MeSH data available.


Quartz crystal sensitivity and linearity for k = 0.5, 1, 2 for Lm1 + ΔLm1 and Lm2 = 123.75 μH ·k, CL = 22 nF.
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f2-sensors-12-03105: Quartz crystal sensitivity and linearity for k = 0.5, 1, 2 for Lm1 + ΔLm1 and Lm2 = 123.75 μH ·k, CL = 22 nF.

Mentions: Figure 2 illustrates the change of inductance values. Lm1 changes for ΔLm1 with the criterion k at the constant capacitance value CL = 22 nF. Simultaneously with Lm1, the inductance Lm2 = 123.75 μH is changed with the same criterion k (Equation (7)). Figure 2 does not display the inductance Lm2 because in relation to k it has a fixed value depending on k. ΔLm1 changes with the change of the length l (Equation (1)) [26–31], and is measured by a HP 4194A impedance/gain-phase analyzer. Figure 2 shows that various frequency sensitivities with the intersection at Lm1 = 123.742 μH (due to different k) are produced. Factor k relates to the compensation criterion C0 [8]. This means that if we simultaneously change k (k1 = 0.5, k2 = 1, k3 = 2), the size of the frequency sensitivity of Lm1 + Δ Lm1 can be determined with the frequency difference for (fk1dif(Lm1), fk2dif(Lm1), fk3dif(Lm1).


New quartz oscillator switching method for nano-Henry range inductance measurements.

Matko V, Jezernik K - Sensors (Basel) (2012)

Quartz crystal sensitivity and linearity for k = 0.5, 1, 2 for Lm1 + ΔLm1 and Lm2 = 123.75 μH ·k, CL = 22 nF.
© Copyright Policy
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3376594&req=5

f2-sensors-12-03105: Quartz crystal sensitivity and linearity for k = 0.5, 1, 2 for Lm1 + ΔLm1 and Lm2 = 123.75 μH ·k, CL = 22 nF.
Mentions: Figure 2 illustrates the change of inductance values. Lm1 changes for ΔLm1 with the criterion k at the constant capacitance value CL = 22 nF. Simultaneously with Lm1, the inductance Lm2 = 123.75 μH is changed with the same criterion k (Equation (7)). Figure 2 does not display the inductance Lm2 because in relation to k it has a fixed value depending on k. ΔLm1 changes with the change of the length l (Equation (1)) [26–31], and is measured by a HP 4194A impedance/gain-phase analyzer. Figure 2 shows that various frequency sensitivities with the intersection at Lm1 = 123.742 μH (due to different k) are produced. Factor k relates to the compensation criterion C0 [8]. This means that if we simultaneously change k (k1 = 0.5, k2 = 1, k3 = 2), the size of the frequency sensitivity of Lm1 + Δ Lm1 can be determined with the frequency difference for (fk1dif(Lm1), fk2dif(Lm1), fk3dif(Lm1).

Bottom Line: The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics.This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency.The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

View Article: PubMed Central - PubMed

Affiliation: Faculty of Electrical Engineering and Computer Science, University of Maribor, Maribor, Slovenia. karel.jezernik@uni-mb.si

ABSTRACT
This article introduces a new method for nano-Henry inductance measurements at the frequency of 4.999 MHz with a single quartz crystal oscillating in the switching oscillating circuit. The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics. This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency. The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.

No MeSH data available.