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Nanoscale elastic modulus of single horizontal ZnO nanorod using nanoindentation experiment.

Soomro MY, Hussain I, Bano N, Broitman E, Nur O, Willander M - Nanoscale Res Lett (2012)

Bottom Line: The elastic modulus of the ZnO NR, extracted from the unloading curve using the well-known Oliver-Pharr method, resulted in a value of approximately 800 GPa.Also, we discuss the NR creep mechanism observed under indentation.The mechanical behavior reported in this paper will be a useful reference for the design and applications of future nanodevices.

View Article: PubMed Central - HTML - PubMed

Affiliation: Department of Science and Technology, Campus Norrköping, Linköping University, Norrköping, SE-60174, Sweden. narba@itn.liu.se.

ABSTRACT
We measure the elastic modulus of a single horizontal ZnO nanorod [NR] grown by a low-temperature hydrothermal chemical process on silicon substrates by performing room-temperature, direct load-controlled nanoindentation measurements. The configuration of the experiment for the single ZnO NR was achieved using a focused ion beam/scanning electron microscope dual-beam instrument. The single ZnO NR was positioned horizontally over a hole on a silicon wafer using a nanomanipulator, and both ends were bonded with platinum, defining a three-point bending configuration. The elastic modulus of the ZnO NR, extracted from the unloading curve using the well-known Oliver-Pharr method, resulted in a value of approximately 800 GPa. Also, we discuss the NR creep mechanism observed under indentation. The mechanical behavior reported in this paper will be a useful reference for the design and applications of future nanodevices.

No MeSH data available.


SEM image showing the morphology of the as-grown ZnO NR arrays grown on silicon substrate. Inset shows a magnified image.
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Figure 1: SEM image showing the morphology of the as-grown ZnO NR arrays grown on silicon substrate. Inset shows a magnified image.

Mentions: The morphology of the as-grown ZnO NRs is shown in Figures 1 (top view) and 2 (side view). The ZnO NRs were found to be aligned vertically and uniformly distributed, with a well-defined hexagonal cross section. The average outer diameter and length of the ZnO NRs were about 200 nm and approximately 4 μm, respectively.


Nanoscale elastic modulus of single horizontal ZnO nanorod using nanoindentation experiment.

Soomro MY, Hussain I, Bano N, Broitman E, Nur O, Willander M - Nanoscale Res Lett (2012)

SEM image showing the morphology of the as-grown ZnO NR arrays grown on silicon substrate. Inset shows a magnified image.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3298492&req=5

Figure 1: SEM image showing the morphology of the as-grown ZnO NR arrays grown on silicon substrate. Inset shows a magnified image.
Mentions: The morphology of the as-grown ZnO NRs is shown in Figures 1 (top view) and 2 (side view). The ZnO NRs were found to be aligned vertically and uniformly distributed, with a well-defined hexagonal cross section. The average outer diameter and length of the ZnO NRs were about 200 nm and approximately 4 μm, respectively.

Bottom Line: The elastic modulus of the ZnO NR, extracted from the unloading curve using the well-known Oliver-Pharr method, resulted in a value of approximately 800 GPa.Also, we discuss the NR creep mechanism observed under indentation.The mechanical behavior reported in this paper will be a useful reference for the design and applications of future nanodevices.

View Article: PubMed Central - HTML - PubMed

Affiliation: Department of Science and Technology, Campus Norrköping, Linköping University, Norrköping, SE-60174, Sweden. narba@itn.liu.se.

ABSTRACT
We measure the elastic modulus of a single horizontal ZnO nanorod [NR] grown by a low-temperature hydrothermal chemical process on silicon substrates by performing room-temperature, direct load-controlled nanoindentation measurements. The configuration of the experiment for the single ZnO NR was achieved using a focused ion beam/scanning electron microscope dual-beam instrument. The single ZnO NR was positioned horizontally over a hole on a silicon wafer using a nanomanipulator, and both ends were bonded with platinum, defining a three-point bending configuration. The elastic modulus of the ZnO NR, extracted from the unloading curve using the well-known Oliver-Pharr method, resulted in a value of approximately 800 GPa. Also, we discuss the NR creep mechanism observed under indentation. The mechanical behavior reported in this paper will be a useful reference for the design and applications of future nanodevices.

No MeSH data available.