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Structural and optical properties of a radio frequency magnetron-sputtered ZnO thin film with different growth angles.

Ko KH, Joung YH, Choi WS, Park M, Lee J, Hwang HS - Nanoscale Res Lett (2012)

Bottom Line: The film thickness was fixed at 100 nm to get a constant experiment condition.Grain sizes of the ZnO films were measured by X-ray diffraction.A UV-visible spectrometer was used to measure the transmittance and reflectance of the ZnO film columnar structures as a function of the growth angles.

View Article: PubMed Central - HTML - PubMed

Affiliation: School of Electrical, Electronics and Control Engineering, Hanbat National University, Daejeon, 305-719, Republic of Korea. wschoi@hanbat.ac.kr.

ABSTRACT
This study introduces optical properties of a columnar structured zinc oxide [ZnO] antireflection coating for solar cells. We obtained ZnO films of columnar structure on glass substrates using a specially designed radio frequency magnetron sputtering system with different growth angles. Field-emission scanning electron microscopy was utilized to check the growth angles of the ZnO films which were controlled at 0°, 15°, and 30°. The film thickness was fixed at 100 nm to get a constant experiment condition. Grain sizes of the ZnO films were measured by X-ray diffraction. A UV-visible spectrometer was used to measure the transmittance and reflectance of the ZnO film columnar structures as a function of the growth angles.

No MeSH data available.


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Optical properties of ZnO films based on growth angles. (a) Transmittance spectra and (b) reflectance spectra.
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Figure 4: Optical properties of ZnO films based on growth angles. (a) Transmittance spectra and (b) reflectance spectra.

Mentions: Figure 4a shows the transmittance patterns of ZnO films with different growth angles. All ZnO films show high transmittance above 90%. The The 0° angled columnar film has the highest transmittance, and the value is approximately 99% at 450 to approximately 500 nm. Figure 4b shows the reflectance patterns of the ZnO films. All ZnO films showed different patterns according to the wavelength of incidence rays. The ZnO film with a 0° growth angle has the lowest reflectance of 10.81% at 418 nm. The 15° angled film has the best condition on average and low values. The transmittance and reflectance are slightly changed by the growth angle of ZnO films.


Structural and optical properties of a radio frequency magnetron-sputtered ZnO thin film with different growth angles.

Ko KH, Joung YH, Choi WS, Park M, Lee J, Hwang HS - Nanoscale Res Lett (2012)

Optical properties of ZnO films based on growth angles. (a) Transmittance spectra and (b) reflectance spectra.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3275453&req=5

Figure 4: Optical properties of ZnO films based on growth angles. (a) Transmittance spectra and (b) reflectance spectra.
Mentions: Figure 4a shows the transmittance patterns of ZnO films with different growth angles. All ZnO films show high transmittance above 90%. The The 0° angled columnar film has the highest transmittance, and the value is approximately 99% at 450 to approximately 500 nm. Figure 4b shows the reflectance patterns of the ZnO films. All ZnO films showed different patterns according to the wavelength of incidence rays. The ZnO film with a 0° growth angle has the lowest reflectance of 10.81% at 418 nm. The 15° angled film has the best condition on average and low values. The transmittance and reflectance are slightly changed by the growth angle of ZnO films.

Bottom Line: The film thickness was fixed at 100 nm to get a constant experiment condition.Grain sizes of the ZnO films were measured by X-ray diffraction.A UV-visible spectrometer was used to measure the transmittance and reflectance of the ZnO film columnar structures as a function of the growth angles.

View Article: PubMed Central - HTML - PubMed

Affiliation: School of Electrical, Electronics and Control Engineering, Hanbat National University, Daejeon, 305-719, Republic of Korea. wschoi@hanbat.ac.kr.

ABSTRACT
This study introduces optical properties of a columnar structured zinc oxide [ZnO] antireflection coating for solar cells. We obtained ZnO films of columnar structure on glass substrates using a specially designed radio frequency magnetron sputtering system with different growth angles. Field-emission scanning electron microscopy was utilized to check the growth angles of the ZnO films which were controlled at 0°, 15°, and 30°. The film thickness was fixed at 100 nm to get a constant experiment condition. Grain sizes of the ZnO films were measured by X-ray diffraction. A UV-visible spectrometer was used to measure the transmittance and reflectance of the ZnO film columnar structures as a function of the growth angles.

No MeSH data available.


Related in: MedlinePlus