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Structural and thermal studies of silver nanoparticles and electrical transport study of their thin films.

Majeed Khan MA, Kumar S, Ahamed M, Alrokayan SA, Alsalhi MS - Nanoscale Res Lett (2011)

Bottom Line: The average grain size of silver nanoparticles is found to be 17.5 nm.The peaks in XRD pattern are in good agreement with that of face-centered-cubic form of metallic silver.The sample shows the activated variable range hopping in the localized states near the Fermi level.

View Article: PubMed Central - HTML - PubMed

Affiliation: King Abdullah Institute for Nanotechnology, King Saud University, Riyadh-11451, Saudi Arabia. majeed_phys@rediffmail.com.

ABSTRACT
This work reports the preparation and characterization of silver nanoparticles synthesized through wet chemical solution method and of silver films deposited by dip-coating method. X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), field emission transmission electron microscopy (FETEM), high-resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), and energy dispersive spectroscopy (EDX) have been used to characterize the prepared silver nanoparticles and thin film. The morphology and crystal structure of silver nanoparticles have been determined by FESEM, HRTEM, and FETEM. The average grain size of silver nanoparticles is found to be 17.5 nm. The peaks in XRD pattern are in good agreement with that of face-centered-cubic form of metallic silver. TGA/DTA results confirmed the weight loss and the exothermic reaction due to desorption of chemisorbed water. The temperature dependence of resistivity of silver thin film, determined in the temperature range of 100-300 K, exhibit semiconducting behavior of the sample. The sample shows the activated variable range hopping in the localized states near the Fermi level.

No MeSH data available.


Related in: MedlinePlus

XRD pattern of silver nanoparticles and inset shows Williamson-Hall plot for the same.
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Figure 1: XRD pattern of silver nanoparticles and inset shows Williamson-Hall plot for the same.

Mentions: Figure 1 shows the XRD pattern of powder silver nanoparticles. The presence of peaks at 2θ values 38.1°, 44.09°, 64.36°, 77.29°, 81.31°, 97.92°, 110.81° and 114.61° corresponds to (111), (200), (220), (311), (222), (400), (331), and (420) planes of silver, respectively. Thus, the XRD spectrum confirmed the crystalline structure of silver nanoparticles. No peaks of other impurity crystalline phases have been detected. All the peaks in XRD pattern can be readily indexed to a face-centered cubic structure of silver as per available literature (JCPDS, File No. 4-0783). The lattice constant calculated from this pattern has been found to be a = 0.4085 nm, which is consistent with the standard value a = 0.4086 nm. The crystallite size (L) of the material of thin film has been evaluated by Scherrer's formula [29]


Structural and thermal studies of silver nanoparticles and electrical transport study of their thin films.

Majeed Khan MA, Kumar S, Ahamed M, Alrokayan SA, Alsalhi MS - Nanoscale Res Lett (2011)

XRD pattern of silver nanoparticles and inset shows Williamson-Hall plot for the same.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211852&req=5

Figure 1: XRD pattern of silver nanoparticles and inset shows Williamson-Hall plot for the same.
Mentions: Figure 1 shows the XRD pattern of powder silver nanoparticles. The presence of peaks at 2θ values 38.1°, 44.09°, 64.36°, 77.29°, 81.31°, 97.92°, 110.81° and 114.61° corresponds to (111), (200), (220), (311), (222), (400), (331), and (420) planes of silver, respectively. Thus, the XRD spectrum confirmed the crystalline structure of silver nanoparticles. No peaks of other impurity crystalline phases have been detected. All the peaks in XRD pattern can be readily indexed to a face-centered cubic structure of silver as per available literature (JCPDS, File No. 4-0783). The lattice constant calculated from this pattern has been found to be a = 0.4085 nm, which is consistent with the standard value a = 0.4086 nm. The crystallite size (L) of the material of thin film has been evaluated by Scherrer's formula [29]

Bottom Line: The average grain size of silver nanoparticles is found to be 17.5 nm.The peaks in XRD pattern are in good agreement with that of face-centered-cubic form of metallic silver.The sample shows the activated variable range hopping in the localized states near the Fermi level.

View Article: PubMed Central - HTML - PubMed

Affiliation: King Abdullah Institute for Nanotechnology, King Saud University, Riyadh-11451, Saudi Arabia. majeed_phys@rediffmail.com.

ABSTRACT
This work reports the preparation and characterization of silver nanoparticles synthesized through wet chemical solution method and of silver films deposited by dip-coating method. X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), field emission transmission electron microscopy (FETEM), high-resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), and energy dispersive spectroscopy (EDX) have been used to characterize the prepared silver nanoparticles and thin film. The morphology and crystal structure of silver nanoparticles have been determined by FESEM, HRTEM, and FETEM. The average grain size of silver nanoparticles is found to be 17.5 nm. The peaks in XRD pattern are in good agreement with that of face-centered-cubic form of metallic silver. TGA/DTA results confirmed the weight loss and the exothermic reaction due to desorption of chemisorbed water. The temperature dependence of resistivity of silver thin film, determined in the temperature range of 100-300 K, exhibit semiconducting behavior of the sample. The sample shows the activated variable range hopping in the localized states near the Fermi level.

No MeSH data available.


Related in: MedlinePlus