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Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy.

Jaafar M, Serrano-Ramón L, Iglesias-Freire O, Fernández-Pacheco A, Ibarra MR, De Teresa JM, Asenjo A - Nanoscale Res Lett (2011)

Bottom Line: In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field.The main result is the quantitative evaluation of the coercive field of the individual nanostructures.Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

View Article: PubMed Central - HTML - PubMed

Affiliation: Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid, 28049, Spain. aasenjo@icmm.csic.es.

ABSTRACT
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

No MeSH data available.


Topography and in-remanence magnetic image of a single-domain nanowire (type C). (a) Topography and (b) MFM image in remanence of nanowire C; (c)-(d) MFM-based mode images (e)-(g) profiles corresponding to hysteresis loops. The frequency shift contrast for all the MFM images is 8.5 Hz.
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Figure 3: Topography and in-remanence magnetic image of a single-domain nanowire (type C). (a) Topography and (b) MFM image in remanence of nanowire C; (c)-(d) MFM-based mode images (e)-(g) profiles corresponding to hysteresis loops. The frequency shift contrast for all the MFM images is 8.5 Hz.

Mentions: Different behavior is observed in narrower wires (labeled C). Figure 3a, b correspond respectively to the topography and in-remanence magnetic image of a single-domain nanowire 260 nm width. Using this MFM-based mode, we have measured the magnetic signal along the dashed line drawn in Figure 3b while increasing (Figure 3c) or decreasing (Figure 3d) the in-plane magnetic fields applied along the x direction. The Y scale in the images is the external magnetic field that is increased (decreased) at each scan line from -350 Oe at the upper line to 300 Oe at the lowest scan line.


Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy.

Jaafar M, Serrano-Ramón L, Iglesias-Freire O, Fernández-Pacheco A, Ibarra MR, De Teresa JM, Asenjo A - Nanoscale Res Lett (2011)

Topography and in-remanence magnetic image of a single-domain nanowire (type C). (a) Topography and (b) MFM image in remanence of nanowire C; (c)-(d) MFM-based mode images (e)-(g) profiles corresponding to hysteresis loops. The frequency shift contrast for all the MFM images is 8.5 Hz.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211502&req=5

Figure 3: Topography and in-remanence magnetic image of a single-domain nanowire (type C). (a) Topography and (b) MFM image in remanence of nanowire C; (c)-(d) MFM-based mode images (e)-(g) profiles corresponding to hysteresis loops. The frequency shift contrast for all the MFM images is 8.5 Hz.
Mentions: Different behavior is observed in narrower wires (labeled C). Figure 3a, b correspond respectively to the topography and in-remanence magnetic image of a single-domain nanowire 260 nm width. Using this MFM-based mode, we have measured the magnetic signal along the dashed line drawn in Figure 3b while increasing (Figure 3c) or decreasing (Figure 3d) the in-plane magnetic fields applied along the x direction. The Y scale in the images is the external magnetic field that is increased (decreased) at each scan line from -350 Oe at the upper line to 300 Oe at the lowest scan line.

Bottom Line: In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field.The main result is the quantitative evaluation of the coercive field of the individual nanostructures.Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

View Article: PubMed Central - HTML - PubMed

Affiliation: Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid, 28049, Spain. aasenjo@icmm.csic.es.

ABSTRACT
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

No MeSH data available.