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Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy.

Jaafar M, Serrano-Ramón L, Iglesias-Freire O, Fernández-Pacheco A, Ibarra MR, De Teresa JM, Asenjo A - Nanoscale Res Lett (2011)

Bottom Line: In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field.The main result is the quantitative evaluation of the coercive field of the individual nanostructures.Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

View Article: PubMed Central - HTML - PubMed

Affiliation: Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid, 28049, Spain. aasenjo@icmm.csic.es.

ABSTRACT
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

No MeSH data available.


Topography and MFM image of a 1-μm-width nanowire (type A). (a) Topography and (b) in-remanence MFM image of nanowire A; (c)-(d) MFM-based mode images obtained along the dashed line in (b); (e) MFM images under different in situ magnetic field. The frequency shift contrast for all the MFM images is 5 Hz.
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Figure 2: Topography and MFM image of a 1-μm-width nanowire (type A). (a) Topography and (b) in-remanence MFM image of nanowire A; (c)-(d) MFM-based mode images obtained along the dashed line in (b); (e) MFM images under different in situ magnetic field. The frequency shift contrast for all the MFM images is 5 Hz.

Mentions: Figure 2 shows the topography (a) and the MFM image (b) of a 1-μm-width nanowire (type A). The magnetic image has been measured in remanence after saturating the sample along its easy axis under an ex situ field of 5 kOe. The magnetic configuration is a complex multidomain structure with multiples vortices. We have performed the MFM-based mode measurements where the tip scans along the dashed line drawn in Figure 2b, located at the center of the wire, while increasing (Figure 2c) or decreasing (Figure 2d) the in-plane magnetic field applied along the x direction. The signal shown in Figure 2c, d corresponds to the frequency shift that is proportional to the magnetic force gradient. The vertical axis in these images is the external magnetic field. In Figure 2c, the magnetic field increases - as shown by the arrow - from -450 Oe (top of the image) to +400 Oe (at the bottom of the image). The subsequent image Figure 2d begins when the magnetic field starts to decrease from +400 Oe (corresponding to the scan at the bottom of the image) to −450 Oe (reached in the top scan).


Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy.

Jaafar M, Serrano-Ramón L, Iglesias-Freire O, Fernández-Pacheco A, Ibarra MR, De Teresa JM, Asenjo A - Nanoscale Res Lett (2011)

Topography and MFM image of a 1-μm-width nanowire (type A). (a) Topography and (b) in-remanence MFM image of nanowire A; (c)-(d) MFM-based mode images obtained along the dashed line in (b); (e) MFM images under different in situ magnetic field. The frequency shift contrast for all the MFM images is 5 Hz.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211502&req=5

Figure 2: Topography and MFM image of a 1-μm-width nanowire (type A). (a) Topography and (b) in-remanence MFM image of nanowire A; (c)-(d) MFM-based mode images obtained along the dashed line in (b); (e) MFM images under different in situ magnetic field. The frequency shift contrast for all the MFM images is 5 Hz.
Mentions: Figure 2 shows the topography (a) and the MFM image (b) of a 1-μm-width nanowire (type A). The magnetic image has been measured in remanence after saturating the sample along its easy axis under an ex situ field of 5 kOe. The magnetic configuration is a complex multidomain structure with multiples vortices. We have performed the MFM-based mode measurements where the tip scans along the dashed line drawn in Figure 2b, located at the center of the wire, while increasing (Figure 2c) or decreasing (Figure 2d) the in-plane magnetic field applied along the x direction. The signal shown in Figure 2c, d corresponds to the frequency shift that is proportional to the magnetic force gradient. The vertical axis in these images is the external magnetic field. In Figure 2c, the magnetic field increases - as shown by the arrow - from -450 Oe (top of the image) to +400 Oe (at the bottom of the image). The subsequent image Figure 2d begins when the magnetic field starts to decrease from +400 Oe (corresponding to the scan at the bottom of the image) to −450 Oe (reached in the top scan).

Bottom Line: In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field.The main result is the quantitative evaluation of the coercive field of the individual nanostructures.Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

View Article: PubMed Central - HTML - PubMed

Affiliation: Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid, 28049, Spain. aasenjo@icmm.csic.es.

ABSTRACT
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.

No MeSH data available.