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Anisotropic TixSn1-xO2 nanostructures prepared by magnetron sputter deposition.

Chen S, Li Z, Zhang Z - Nanoscale Res Lett (2011)

Bottom Line: Regular arrays of TixSn1-xO2 nanoflakes were fabricated through glancing angle sputter deposition onto self-assembled close-packed arrays of 200-nm-diameter polystyrene spheres.The reflectance measurements showed that the melon seed-shaped nanoflakes exhibited optimal properties of antireflection in the entire visible and ultraviolet region.In addition, we determined their anisotropic reflectance in the direction parallel to the surface of nanoflakes and perpendicular to it, arising from the anisotropic morphology.

View Article: PubMed Central - HTML - PubMed

Affiliation: State Key Laboratory of New Ceramic and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China. zcli@tsinghua.edu.cn.

ABSTRACT
Regular arrays of TixSn1-xO2 nanoflakes were fabricated through glancing angle sputter deposition onto self-assembled close-packed arrays of 200-nm-diameter polystyrene spheres. The morphology of nanostructures could be controlled by simply adjusting the sputtering power of the Ti target. The reflectance measurements showed that the melon seed-shaped nanoflakes exhibited optimal properties of antireflection in the entire visible and ultraviolet region. In addition, we determined their anisotropic reflectance in the direction parallel to the surface of nanoflakes and perpendicular to it, arising from the anisotropic morphology.

No MeSH data available.


Scanning electron micrograph from a close-packed array of 200-nm-diameter polystyrene spheres on Si (001) substrates.
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Figure 2: Scanning electron micrograph from a close-packed array of 200-nm-diameter polystyrene spheres on Si (001) substrates.

Mentions: Figure 2 shows the typical SEM micrograph of the Si(001) substrate which is covered with a regular, hexagonal close-packed array of 200-nm-diameter polystyrene spheres. The polystyrene sphere layer exhibits various crystalline defects, including the vacancy, dislocation, and grain boundary, as illustrated in this figure. The formation of defects is attributed to a combination of the nanosphere's polydispersity and kinetic limitations during the drying process.


Anisotropic TixSn1-xO2 nanostructures prepared by magnetron sputter deposition.

Chen S, Li Z, Zhang Z - Nanoscale Res Lett (2011)

Scanning electron micrograph from a close-packed array of 200-nm-diameter polystyrene spheres on Si (001) substrates.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211414&req=5

Figure 2: Scanning electron micrograph from a close-packed array of 200-nm-diameter polystyrene spheres on Si (001) substrates.
Mentions: Figure 2 shows the typical SEM micrograph of the Si(001) substrate which is covered with a regular, hexagonal close-packed array of 200-nm-diameter polystyrene spheres. The polystyrene sphere layer exhibits various crystalline defects, including the vacancy, dislocation, and grain boundary, as illustrated in this figure. The formation of defects is attributed to a combination of the nanosphere's polydispersity and kinetic limitations during the drying process.

Bottom Line: Regular arrays of TixSn1-xO2 nanoflakes were fabricated through glancing angle sputter deposition onto self-assembled close-packed arrays of 200-nm-diameter polystyrene spheres.The reflectance measurements showed that the melon seed-shaped nanoflakes exhibited optimal properties of antireflection in the entire visible and ultraviolet region.In addition, we determined their anisotropic reflectance in the direction parallel to the surface of nanoflakes and perpendicular to it, arising from the anisotropic morphology.

View Article: PubMed Central - HTML - PubMed

Affiliation: State Key Laboratory of New Ceramic and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China. zcli@tsinghua.edu.cn.

ABSTRACT
Regular arrays of TixSn1-xO2 nanoflakes were fabricated through glancing angle sputter deposition onto self-assembled close-packed arrays of 200-nm-diameter polystyrene spheres. The morphology of nanostructures could be controlled by simply adjusting the sputtering power of the Ti target. The reflectance measurements showed that the melon seed-shaped nanoflakes exhibited optimal properties of antireflection in the entire visible and ultraviolet region. In addition, we determined their anisotropic reflectance in the direction parallel to the surface of nanoflakes and perpendicular to it, arising from the anisotropic morphology.

No MeSH data available.