Limits...
Cohesive strength of nanocrystalline ZnO:Ga thin films deposited at room temperature.

Samantilleke AP, Rebouta LM, Garim V, Rubio-Peña L, Lanceros-Mendez S, Alpuim P, Carvalho S, Kudrin AV, Danilov YA - Nanoscale Res Lett (2011)

Bottom Line: The COS is similar for different GZO coatings and occurs for nominal strains approx. 1%.The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa.For these calculations, a Young's modulus of 112 GPa was used, evaluated by nanoindentation.

View Article: PubMed Central - HTML - PubMed

Affiliation: Centro de Física, Universidade do Minho, Azurém, 4800-058 Guimarães, Portugal. anura@fisica.uminho.pt.

ABSTRACT
In this study, transparent conducting nanocrystalline ZnO:Ga (GZO) films were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivities of 8.8 × 10-4 and 2.2 × 10-3 Ω cm were obtained for films deposited on glass and polymers, respectively. The crack onset strain (COS) and the cohesive strength of the coatings were investigated by means of tensile testing. The COS is similar for different GZO coatings and occurs for nominal strains approx. 1%. The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa. For these calculations, a Young's modulus of 112 GPa was used, evaluated by nanoindentation.

No MeSH data available.


Related in: MedlinePlus

XRD analysis for GZO thin films prepared under different Pws.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
getmorefigures.php?uid=PMC3211395&req=5

Figure 1: XRD analysis for GZO thin films prepared under different Pws.

Mentions: Figure 1a shows the XRD spectra obtained for nc GZO thin films (approx. 100-nm thick) as a function of the Pw, where only the ZnO (002) peak, at approx. 34°, is observed. The spectra reveal a highly textured hexagonal phase with a wurtzite structure. A lower Pw resulted in samples with a higher c-lattice parameter. In the thin films prepared with a Pw, between 0.41 and 0.86 Pa, the (002) peak position shifted from 2θ = 33.93° (c = 0.528 nm) to 2θ = 34.06° (c = 0.525 nm). The full-width at half-maximum (FWHM) can be expressed as a linear combination of the lattice strain and crystalline size. The effects of strain and particle size on the FWHM can be expressed as [7](1)


Cohesive strength of nanocrystalline ZnO:Ga thin films deposited at room temperature.

Samantilleke AP, Rebouta LM, Garim V, Rubio-Peña L, Lanceros-Mendez S, Alpuim P, Carvalho S, Kudrin AV, Danilov YA - Nanoscale Res Lett (2011)

XRD analysis for GZO thin films prepared under different Pws.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211395&req=5

Figure 1: XRD analysis for GZO thin films prepared under different Pws.
Mentions: Figure 1a shows the XRD spectra obtained for nc GZO thin films (approx. 100-nm thick) as a function of the Pw, where only the ZnO (002) peak, at approx. 34°, is observed. The spectra reveal a highly textured hexagonal phase with a wurtzite structure. A lower Pw resulted in samples with a higher c-lattice parameter. In the thin films prepared with a Pw, between 0.41 and 0.86 Pa, the (002) peak position shifted from 2θ = 33.93° (c = 0.528 nm) to 2θ = 34.06° (c = 0.525 nm). The full-width at half-maximum (FWHM) can be expressed as a linear combination of the lattice strain and crystalline size. The effects of strain and particle size on the FWHM can be expressed as [7](1)

Bottom Line: The COS is similar for different GZO coatings and occurs for nominal strains approx. 1%.The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa.For these calculations, a Young's modulus of 112 GPa was used, evaluated by nanoindentation.

View Article: PubMed Central - HTML - PubMed

Affiliation: Centro de Física, Universidade do Minho, Azurém, 4800-058 Guimarães, Portugal. anura@fisica.uminho.pt.

ABSTRACT
In this study, transparent conducting nanocrystalline ZnO:Ga (GZO) films were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivities of 8.8 × 10-4 and 2.2 × 10-3 Ω cm were obtained for films deposited on glass and polymers, respectively. The crack onset strain (COS) and the cohesive strength of the coatings were investigated by means of tensile testing. The COS is similar for different GZO coatings and occurs for nominal strains approx. 1%. The cohesive strength of coatings, which was evaluated from the initial part of the crack density evolution, was found to be between 1.3 and 1.4 GPa. For these calculations, a Young's modulus of 112 GPa was used, evaluated by nanoindentation.

No MeSH data available.


Related in: MedlinePlus