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Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.


Zn (a) and W (b) rich emitting areas of a ZnO-ZnWO4 thin layer deposited by magnetron sputtering.
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Figure 4: Zn (a) and W (b) rich emitting areas of a ZnO-ZnWO4 thin layer deposited by magnetron sputtering.

Mentions: Post image processing can be carried out on Figure 3e to 3h to define ZnO and ZnWO4 rich areas. First, the pixel to pixel difference Figure 3f - Figure 3e (resp. Figure 3h - Figure 3g) gives the distribution of Zn (resp. W) luminescent sites. Then, to enhance the contrast, these two images are further converted in black and white scale. By this way we get two intermediate images, which are then used to obtain a chemical mapping of the layer: the ZnO rich emitting areas can be obtained by difference of these intermediate images (Figure 4a), since Zn is present in both materials while W can be found only in ZnWO4 grains. Finally, a logic operation 'AND' is applied between the intermediate images to highlight the distribution of emitting ZnWO4 (Figure 4b) since Zn must be present in both materials. In fact a white pixel in Figure 4b is obtained only if the same pixel appears simultaneously white on both intermediate images. This image processing leads to a two-level (black and white) image which increases significantly the contrast. Since Figure 4a shows only few features, one can conclude the emitting centres are almost pure ZnWO4, as confirmed by XRD and micro-Raman analysis [16]. No obvious correlation with the topography is noticeable, since the emitting zones are not specifically centered in the grains.


Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Zn (a) and W (b) rich emitting areas of a ZnO-ZnWO4 thin layer deposited by magnetron sputtering.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211394&req=5

Figure 4: Zn (a) and W (b) rich emitting areas of a ZnO-ZnWO4 thin layer deposited by magnetron sputtering.
Mentions: Post image processing can be carried out on Figure 3e to 3h to define ZnO and ZnWO4 rich areas. First, the pixel to pixel difference Figure 3f - Figure 3e (resp. Figure 3h - Figure 3g) gives the distribution of Zn (resp. W) luminescent sites. Then, to enhance the contrast, these two images are further converted in black and white scale. By this way we get two intermediate images, which are then used to obtain a chemical mapping of the layer: the ZnO rich emitting areas can be obtained by difference of these intermediate images (Figure 4a), since Zn is present in both materials while W can be found only in ZnWO4 grains. Finally, a logic operation 'AND' is applied between the intermediate images to highlight the distribution of emitting ZnWO4 (Figure 4b) since Zn must be present in both materials. In fact a white pixel in Figure 4b is obtained only if the same pixel appears simultaneously white on both intermediate images. This image processing leads to a two-level (black and white) image which increases significantly the contrast. Since Figure 4a shows only few features, one can conclude the emitting centres are almost pure ZnWO4, as confirmed by XRD and micro-Raman analysis [16]. No obvious correlation with the topography is noticeable, since the emitting zones are not specifically centered in the grains.

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.