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Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.


Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L3threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.
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Figure 3: Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L3threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.

Mentions: A ZnWO4 - ZnO thin layer (~400 nm) was prepared by co-sputtering Zn and W onto a silicon substrate, followed by a 900°C annealing in air. In Figure 3 we show twin images corresponding to the simultaneous record of both topography and luminescence cartography of the ZnWO4 - ZnO sample at various incident energies. In upper Figures 3-a, b, c, d the topography is presented. Grains of 0.5 to more than 1μm are observed, as was confirmed by conventional Atomic Force Microscopy. In Figures 3-e, f, g, h we present the corresponding luminescence cartography obtained respectively, from the left to the right, before and after the Zn-K edge, as well as before and after the W-L edge. Images 3a to 3 h contain 1024 × 1024 pixels. The remarkable stability of the instrument is noticeable, since it took about 8 h for recording this whole set of images. Image 3 g, obtained at higher X-ray energy than the Zn threshold, also highlights Zn rich regions. The contrast is lower than in Figure 3f since the acquisition is performed far from the maximum emission. Black zones correspond to non emitting or to grains emitting out of the fibre acceptance angle.


Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L3threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211394&req=5

Figure 3: Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L3threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.
Mentions: A ZnWO4 - ZnO thin layer (~400 nm) was prepared by co-sputtering Zn and W onto a silicon substrate, followed by a 900°C annealing in air. In Figure 3 we show twin images corresponding to the simultaneous record of both topography and luminescence cartography of the ZnWO4 - ZnO sample at various incident energies. In upper Figures 3-a, b, c, d the topography is presented. Grains of 0.5 to more than 1μm are observed, as was confirmed by conventional Atomic Force Microscopy. In Figures 3-e, f, g, h we present the corresponding luminescence cartography obtained respectively, from the left to the right, before and after the Zn-K edge, as well as before and after the W-L edge. Images 3a to 3 h contain 1024 × 1024 pixels. The remarkable stability of the instrument is noticeable, since it took about 8 h for recording this whole set of images. Image 3 g, obtained at higher X-ray energy than the Zn threshold, also highlights Zn rich regions. The contrast is lower than in Figure 3f since the acquisition is performed far from the maximum emission. Black zones correspond to non emitting or to grains emitting out of the fibre acceptance angle.

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.