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Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.


XAFS-XEOL recorded spectra of - a: the sputtered ZnO film obtained in near-field; - b: the ZnO film (bottom) and of a reference stoichiometric ZnO powder (top) by conventional technique. Spectra are expanded for clarity.
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Figure 2: XAFS-XEOL recorded spectra of - a: the sputtered ZnO film obtained in near-field; - b: the ZnO film (bottom) and of a reference stoichiometric ZnO powder (top) by conventional technique. Spectra are expanded for clarity.

Mentions: In Figure 2a we present the XAFS-XEOL spectrum obtained with the apparatus at ESRF ID03 line of a ZnO thin layer (~400 nm), prepared by Zn sputtering on a silicon substrate, followed by a 900°C annealing in air. The threshold, localized at 9664 eV, is characteristic of visible light emitted by Zn atoms after X-Ray absorption. This spectrum is compared with that of the same sample (Figure 2b, bottom) and with that of a commercial stoichiometric ZnO powder sample for reference (Figure 2b, top, shifted), obtained in conventional XAFS-XEOL spectroscopy, in far field, at the same beamline. Spectra shown in Figure 2b are in very good agreement in terms of both peak positions and relative magnitudes measured with respect to the average signal above threshold. This indicates that the ZnO sputtered layer is stoichiometric. The great concordance between spectra Figure 2a and Figure 2b validates the instrument concept.


Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

XAFS-XEOL recorded spectra of - a: the sputtered ZnO film obtained in near-field; - b: the ZnO film (bottom) and of a reference stoichiometric ZnO powder (top) by conventional technique. Spectra are expanded for clarity.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211394&req=5

Figure 2: XAFS-XEOL recorded spectra of - a: the sputtered ZnO film obtained in near-field; - b: the ZnO film (bottom) and of a reference stoichiometric ZnO powder (top) by conventional technique. Spectra are expanded for clarity.
Mentions: In Figure 2a we present the XAFS-XEOL spectrum obtained with the apparatus at ESRF ID03 line of a ZnO thin layer (~400 nm), prepared by Zn sputtering on a silicon substrate, followed by a 900°C annealing in air. The threshold, localized at 9664 eV, is characteristic of visible light emitted by Zn atoms after X-Ray absorption. This spectrum is compared with that of the same sample (Figure 2b, bottom) and with that of a commercial stoichiometric ZnO powder sample for reference (Figure 2b, top, shifted), obtained in conventional XAFS-XEOL spectroscopy, in far field, at the same beamline. Spectra shown in Figure 2b are in very good agreement in terms of both peak positions and relative magnitudes measured with respect to the average signal above threshold. This indicates that the ZnO sputtered layer is stoichiometric. The great concordance between spectra Figure 2a and Figure 2b validates the instrument concept.

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.