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Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.


Principle of the home-built instrument. The instrument combines shear-force microscopy and XEOL spectroscopy.
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Figure 1: Principle of the home-built instrument. The instrument combines shear-force microscopy and XEOL spectroscopy.

Mentions: The apparatus consists in an home-made shear-force microscope (see Figure 1) whose probe is a sharp Aluminium-coated optical fibre (aperture 50 nm) that locally collects the visible light emitted by the sample illuminated by X-Ray radiation (synchrotron environment). The instrument, working in ambient conditions or in liquid environment, allows simultaneous pixel by pixel surface topography measurement and chemical mapping [15]. The analysed sample must fit with Scanning Probe Microscopy requirements (solid sample, roughness in the micronscale range). This apparatus is evaluated by characterization of ZnO and ZnWO4 - ZnO thin layers, exhibiting a high luminescence yield. The luminescence spectra are compared to those obtained in far field


Combining scanning probe microscopy and x-ray spectroscopy.

Fauquet C, Dehlinger M, Jandard F, Ferrero S, Pailharey D, Larcheri S, Graziola R, Purans J, Bjeoumikhov A, Erko A, Zizak I, Dahmani B, Tonneau D - Nanoscale Res Lett (2011)

Principle of the home-built instrument. The instrument combines shear-force microscopy and XEOL spectroscopy.
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC3211394&req=5

Figure 1: Principle of the home-built instrument. The instrument combines shear-force microscopy and XEOL spectroscopy.
Mentions: The apparatus consists in an home-made shear-force microscope (see Figure 1) whose probe is a sharp Aluminium-coated optical fibre (aperture 50 nm) that locally collects the visible light emitted by the sample illuminated by X-Ray radiation (synchrotron environment). The instrument, working in ambient conditions or in liquid environment, allows simultaneous pixel by pixel surface topography measurement and chemical mapping [15]. The analysed sample must fit with Scanning Probe Microscopy requirements (solid sample, roughness in the micronscale range). This apparatus is evaluated by characterization of ZnO and ZnWO4 - ZnO thin layers, exhibiting a high luminescence yield. The luminescence spectra are compared to those obtained in far field

Bottom Line: Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown.Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample.Preliminary results on Co-Ti sample analysis are presented.

View Article: PubMed Central - HTML - PubMed

Affiliation: Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

ABSTRACT
A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

No MeSH data available.