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Perpendicular Magnetic Anisotropy in FePt Patterned Media Employing a CrV Seed Layer

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ABSTRACT

A thin FePt film was deposited onto a CrV seed layer at 400°C and showed a high coercivity (~3,400 Oe) and high magnetization (900–1,000 emu/cm3) characteristic of L10 phase. However, the magnetic properties of patterned media fabricated from the film stack were degraded due to the Ar-ion bombardment. We employed a deposition-last process, in which FePt film deposited at room temperature underwent lift-off and post-annealing processes, to avoid the exposure of FePt to Ar plasma. A patterned medium with 100-nm nano-columns showed an out-of-plane coercivity fivefold larger than its in-plane counterpart and a remanent magnetization comparable to saturation magnetization in the out-of-plane direction, indicating a high perpendicular anisotropy. These results demonstrate the high perpendicular anisotropy in FePt patterned media using a Cr-based compound seed layer for the first time and suggest that ultra-high-density magnetic recording media can be achieved using this optimized top-down approach.

No MeSH data available.


a M vs. H curves at room temperature for the as-grown film (out-of-plane) and a patterned medium with 100-nm-sized columns (out-of-plane and in-plane). b Out-of-plane M vs. H curves for the as-grown film and patterned media with 100 and 50 nm columns. c XRD pattern of a patterned medium with 100-nm-sized columns.
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Figure 3: a M vs. H curves at room temperature for the as-grown film (out-of-plane) and a patterned medium with 100-nm-sized columns (out-of-plane and in-plane). b Out-of-plane M vs. H curves for the as-grown film and patterned media with 100 and 50 nm columns. c XRD pattern of a patterned medium with 100-nm-sized columns.

Mentions: We carried out magnetic field sweepings on the patterned media to investigate the magnetization (M) versus magnetic field (H) behaviors of the media, using a SQUID. Figure 3a shows the M versus H loops measured at room temperature for the as-grown FePt film (out-of-plane) and a patterned medium with 100-nm-sized columns (both in-plane and out-of-plane). The saturation magnetization (Ms,film) and coercivity (Hc,film) of the as-grown film are 900–1,000 emu/cm3 and ~3,400 Oe, respectively, which are close to those previously reported for FePt L10 phase [8]. These values and the high ratio of remanent magnetization (Mr,film) to saturation magnetization, Mr,film/Ms,film ≈ 1, may be another indicators that the FePt film was ordered into L10 phase during deposition at 400°C. It is believed that the formation of complete L10 phase at a temperature lower than widely adopted post-annealing temperatures (500–800°C) [15,21-23] is attributed to both the high surface diffusivity of adatoms at the elevated deposition temperature and good morphology transfer from the CrV seed layer to a growing FePt film.


Perpendicular Magnetic Anisotropy in FePt Patterned Media Employing a CrV Seed Layer
a M vs. H curves at room temperature for the as-grown film (out-of-plane) and a patterned medium with 100-nm-sized columns (out-of-plane and in-plane). b Out-of-plane M vs. H curves for the as-grown film and patterned media with 100 and 50 nm columns. c XRD pattern of a patterned medium with 100-nm-sized columns.
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Related In: Results  -  Collection

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getmorefigures.php?uid=PMC3211176&req=5

Figure 3: a M vs. H curves at room temperature for the as-grown film (out-of-plane) and a patterned medium with 100-nm-sized columns (out-of-plane and in-plane). b Out-of-plane M vs. H curves for the as-grown film and patterned media with 100 and 50 nm columns. c XRD pattern of a patterned medium with 100-nm-sized columns.
Mentions: We carried out magnetic field sweepings on the patterned media to investigate the magnetization (M) versus magnetic field (H) behaviors of the media, using a SQUID. Figure 3a shows the M versus H loops measured at room temperature for the as-grown FePt film (out-of-plane) and a patterned medium with 100-nm-sized columns (both in-plane and out-of-plane). The saturation magnetization (Ms,film) and coercivity (Hc,film) of the as-grown film are 900–1,000 emu/cm3 and ~3,400 Oe, respectively, which are close to those previously reported for FePt L10 phase [8]. These values and the high ratio of remanent magnetization (Mr,film) to saturation magnetization, Mr,film/Ms,film ≈ 1, may be another indicators that the FePt film was ordered into L10 phase during deposition at 400°C. It is believed that the formation of complete L10 phase at a temperature lower than widely adopted post-annealing temperatures (500–800°C) [15,21-23] is attributed to both the high surface diffusivity of adatoms at the elevated deposition temperature and good morphology transfer from the CrV seed layer to a growing FePt film.

View Article: PubMed Central - HTML - PubMed

ABSTRACT

A thin FePt film was deposited onto a CrV seed layer at 400°C and showed a high coercivity (~3,400 Oe) and high magnetization (900–1,000 emu/cm3) characteristic of L10 phase. However, the magnetic properties of patterned media fabricated from the film stack were degraded due to the Ar-ion bombardment. We employed a deposition-last process, in which FePt film deposited at room temperature underwent lift-off and post-annealing processes, to avoid the exposure of FePt to Ar plasma. A patterned medium with 100-nm nano-columns showed an out-of-plane coercivity fivefold larger than its in-plane counterpart and a remanent magnetization comparable to saturation magnetization in the out-of-plane direction, indicating a high perpendicular anisotropy. These results demonstrate the high perpendicular anisotropy in FePt patterned media using a Cr-based compound seed layer for the first time and suggest that ultra-high-density magnetic recording media can be achieved using this optimized top-down approach.

No MeSH data available.