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Hydrostatic low-range pressure applications of the Paris-Edinburgh cell utilizing polymer gaskets for diffuse X-ray scattering measurements.

Chapman KW, Chupas PJ, Kurtz CA, Locke DR, Parise JB, Hriljac JA - J Appl Crystallogr (2007)

Bottom Line: The use of a polymeric Torlon (polyamide-imide) gasket material in a Paris-Edinburgh pressure cell for in situ high-pressure X-ray scattering measurements is demonstrated.The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01-0.42 GPa.The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.

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ABSTRACT
The use of a polymeric Torlon (polyamide-imide) gasket material in a Paris-Edinburgh pressure cell for in situ high-pressure X-ray scattering measurements is demonstrated. The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01-0.42 GPa. The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.

No MeSH data available.


The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).
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fig2: The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).

Mentions: Above 10 bar applied pressure, the Torlon gasket was sufficiently compressed to generate pressure at the sample. This corresponds to ∼10% of the applied pressure required to generate pressure using the boron–epoxy gasket in an identical setup. The sample pressure increased with applied pressure at a rate of ∼0.045 GPa per 10 bar (Fig. 2 ▶) until gasket failure at above 100 bar (0.042 GPa). In contrast to the near linear behavior observed here, the increase in sample pressure with the boron–epoxy gasket often decreases at higher pressures with plastic deformation of the anvils.


Hydrostatic low-range pressure applications of the Paris-Edinburgh cell utilizing polymer gaskets for diffuse X-ray scattering measurements.

Chapman KW, Chupas PJ, Kurtz CA, Locke DR, Parise JB, Hriljac JA - J Appl Crystallogr (2007)

The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).
© Copyright Policy - open-access
Related In: Results  -  Collection

License
Show All Figures
getmorefigures.php?uid=PMC2483494&req=5

fig2: The sample pressures generated at various applied pressures. Low-angle diffraction images (top inset) show the diffraction texture which develops for the gasket. A representative Rietveld refinement profile is shown (inset).
Mentions: Above 10 bar applied pressure, the Torlon gasket was sufficiently compressed to generate pressure at the sample. This corresponds to ∼10% of the applied pressure required to generate pressure using the boron–epoxy gasket in an identical setup. The sample pressure increased with applied pressure at a rate of ∼0.045 GPa per 10 bar (Fig. 2 ▶) until gasket failure at above 100 bar (0.042 GPa). In contrast to the near linear behavior observed here, the increase in sample pressure with the boron–epoxy gasket often decreases at higher pressures with plastic deformation of the anvils.

Bottom Line: The use of a polymeric Torlon (polyamide-imide) gasket material in a Paris-Edinburgh pressure cell for in situ high-pressure X-ray scattering measurements is demonstrated.The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01-0.42 GPa.The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.

View Article: PubMed Central - HTML - PubMed

ABSTRACT
The use of a polymeric Torlon (polyamide-imide) gasket material in a Paris-Edinburgh pressure cell for in situ high-pressure X-ray scattering measurements is demonstrated. The relatively low bulk modulus of the gasket allows for fine control of the sample pressure over the range 0.01-0.42 GPa. The quality of the data obtained in this way is suitable for Bragg and pair distribution function analysis.

No MeSH data available.